Network behavior in thin film growth dynamics

Physical Review B - Condensed Matter and Materials Physics

Volumn 79, Issue 19, 2009, Pages

  Karabacak, T ^a   Guclu, H ^b   Yuksel, M ^c  

^a University of Arkansas at Little Rock   (United States)

^b ROCHESTER INSTITUTE OF TECHNOLOGY   (United States)

^c Department of Computer Science and Engineering   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 67449108454     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.79.195418     Document Type: Article

References (46)

1. D. L. Smith, Thin-Film Deposition: Principles and Practice (McGraw-Hill, New York, 1995).
2. P. Meakin, Fractals, Scaling, and Growth Far from Equilibrium (Cambridge University Press, Cambridge, England, 1998).
3. A.-L. Barabasi and H. E. Stanley, Fractal Concepts in Surface Growth (Cambridge University Press, Cambridge, England, 1995).
4. N. O. Young and J. Kowal, Nature (London) 183, 104 (1959). 10.1038/183104a0
5. T. Motohiro and Y. Taga, Appl. Opt. 28, 2466 (1989). 10.1364/AO.28.002466
6. R. M. Azzam, Appl. Phys. Lett. 61, 3118 (1992). 10.1063/1.107979
7. K. Robbie, M. J. Brett, and A. Lakhtakia, Nature (London) 384, 616 (1996). 10.1038/384616a0
8. K. Robbie, G. Beydaghyan, T. Brown, C. Dean, J. Adams, and C. Buzea, Rev. Sci. Instrum. 75, 1089 (2004). 10.1063/1.1667254
9. T. Karabacak and T. M. Lu, in Handbook of Theoretical and Computational Nanotechnology, edited by, M. Reith, and, W Schommers, (American Scientific, Stevenson Ranch, CA, 2005), Chap., p. 729.
10. T. Karabacak, G.-C. Wang, and T.-M. Lu, J. Vac. Sci. Technol. A 22, 1778 (2004). 10.1116/1.1743178
11. A. Lakhtakia and R. Messier, Sculptured Thin Films: Nanoengineered Morphology and Optics (SPIE Press, Bellingham, WA, 2005).
12. F. Family and T. Vicsek, J. Phys. A 18, L75 (1985). 10.1088/0305-4470/18/ 2/005
13. F. Family, J. Phys. A 19, L441 (1986). 10.1088/0305-4470/19/8/006
14. M. Pelliccione and T.-M. Lu, Evolution of Thin Film Morphology: Modeling and Simulations (Springer, New York, 2007).
15. T.-M. Lu, Y.-P. Zhao, J. T. Drotar, T. Karabacak, and G.-C. Wang, Morphological and Compositional Evolution of Thin Films, MRS Symposia Proceedings No. 749 (Materials Research Society, Pittsburgh, 2003), p. 3.
16. M. Pelliccione, T. Karabacak, and T.-M. Lu, Phys. Rev. Lett. 96, 146105 (2006). 10.1103/PhysRevLett.96.146105
17. M. Pelliccione, T. Karabacak, C. Gaire, G.-C. Wang, and T.-M. Lu, Phys. Rev. B 74, 125420 (2006). 10.1103/PhysRevB.74.125420
18. Y.-P. Zhao, G.-C. Wang, and T.-M. Lu, Characterization of Amorphous and Crystalline Rough Surfaces: Principles and Applications (Academic Press, New York, 2001).
19. F. Family and T. Viscek, Dynamics of Fractal Surfaces (World Scientific, Singapore, 1991).
20. Survey of experimental β values is obtained by updating the data presented in Ref.
21. R. P. U. Karunasiri, R. Bruinsma, and J. Rudnick, Phys. Rev. Lett. 62, 788 (1989). 10.1103/PhysRevLett.62.788
22. T. Karabacak, Y.-P. Zhao, G.-C. Wang, and T.-M. Lu, Phys. Rev. B 64, 085323 (2001). 10.1103/PhysRevB.64.085323
23. T. Karabacak, Y.-P. Zhao, G.-C. Wang, and T.-M. Lu, Phys. Rev. B 66, 075329 (2002). 10.1103/PhysRevB.66.075329
24. X. Xu and D. W. Goodman, Appl. Phys. Lett. 61, 1799 (1992). 10.1063/1.108404
25. E. M. van Veldhuizen and F. J. de Hoog, J. Phys. D 17, 953 (1984). 10.1088/0022-3727/17/5/010
26. A. Bogaerts, J. Naylor, M. Hatcher, W. J. Jones, and R. Mason, J. Vac. Sci. Technol. A 16, 2400 (1998). 10.1116/1.581359
27. K. Obara, Z. Fu, M. Arima, T. Yamada, T. Fujikawa, N. Imamura, and N. Terada, J. Cryst. Growth 237-239, 2041 (2002). 10.1016/S0022-0248(01)02306-5
28. K. Sakai, S. Migita, H. Ota, Z. Mori, and R. Aoki, Thin Solid Films 281-282, 510 (1996). 10.1016/0040-6090(96)08687-7
29. A. Bogaerts, E. Wagner, B. W. Smith, J. D. Winefordner, D. Pollmann, W. W. Harrison, and R. Gijbels, Spectrochim. Acta, Part B 52, 205 (1997). 10.1016/S0584-8547(96)01577-7
30. A. J. Toprac, B. P. Jones, J. Schlueter, and T. S. Cale, Evolution of Thin Films and Surface Structure and Morphology, MRS Symposia Proceedings No. 355 (Materials Research Society, Pittsburgh, 1995), p. 575.
31. O. Yamazaki, K. Iyanagi, S. Takagi, and K. Nanbu, Jpn. J. Appl. Phys., Part 1 41, 1230 (2002). 10.1143/JJAP.41.1230
32. D. Liu, S. K. Dew, M. J. Brett, T. Smy, and W. Tsai, J. Appl. Phys. 75, 8114 (1994). 10.1063/1.356531
33. R. J. Buss, P. Ho, W. G. Breiland, and M. E. Coltrin, in Deposition and Growth: Limits for Microelectronics, AIP Conf. Proc. No. 167, edited by, G. W. Rubloff, (AIP, New York, 1988), p. 34.
34. R. J. Buss, P. Ho, W. G. Breiland, and M. E. Coltrin, J. Appl. Phys. 63, 2808 (1988). 10.1063/1.340982
35. C. C. Tsai, J. G. Shaw, B. Wacker, and J. C. Knights, Amorphous Silicon Semiconductors-Pure and Hydrogenated Symposium, MRS Symposia Proceedings No. 95 (Materials Research Society, Pittsburgh, 1987), p. 219.
36. J. Perrin and T. Broekhuizen, Photon, Beam, and Plasma Stimulated Chemical Processes at Surfaces, MRS Symposia Proceedings No. 75 (Materials Research Society, Pittsburgh, 1987), p. 201.
37. J. Perrin and T. Broekhuizen, Appl. Phys. Lett. 50, 433 (1987). 10.1063/1.98165
38. R. Robertson and A. Gallagher, J. Appl. Phys. 59, 3402 (1986). 10.1063/1.336806
39. J. Robertson, J. Non-Cryst. Solids 266-269, 79 (2000). 10.1016/S0022-3093(00)00012-0
40. J. T. Drotar, Y.-P. Zhao, T.-M. Lu, and G.-C. Wang, Phys. Rev. B 61, 3012 (2000). 10.1103/PhysRevB.61.3012
41. T. Karabacak, J. P. Singh, Y.-P. Zhao, G.-C. Wang, and T.-M. Lu, Phys. Rev. B 68, 125408 (2003). 10.1103/PhysRevB.68.125408
42. T. Karabacak, G.-C. Wang, and T.-M. Lu, J. Appl. Phys. 94, 7723 (2003). 10.1063/1.1621717
43. T. Smy, D. Vick, M. J. Brett, S. K. Dew, A. T. Wu, J. C. Sit, and K. D. Harris, J. Vac. Sci. Technol. A 18, 2507 (2000). 10.1116/1.1286394
44. S. Boccaletti, V. Latora, Y. Moreno, M. Chavez, and D.-U. Hwang, Phys. Rep. 424, 175 (2006). 10.1016/j.physrep.2005.10.009
45. D. J. Watts and S. H. Strogatz, Nature (London) 393, 440 (1998). 10.1038/30918
46. A.-L. Barabási and R. Albert, Science 286, 509 (1999). 10.1126/science.286.5439.509