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Volumn 61, Issue 4, 2000, Pages 3012-3021

Mechanisms for plasma and reactive ion etch-front roughening

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EID: 0001722905     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.61.3012     Document Type: Article
Times cited : (106)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.