Effects of electrodes on the properties of sol-gel PZT based capacitors in FeRAM

Solid-State Electronics

Volumn 53, Issue 5, 2009, Pages 473-477

  Zhang, Ming Ming ^a   Jia, Ze ^a   Ren, Tian Ling ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

Crystallization; Electrode; Fatigue; FeRAM; Leakage; PZT

Indexed keywords

EID: 67349286894     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sse.2009.03.005     Document Type: Letter

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