Effects of chemical stability of platinum/lead zirconate titanate and iridium oxide/lead zirconate titanate interfaces on ferroelectric thin film switching reliability

Applied Physics Letters

Volumn 91, Issue 23, 2007, Pages

  Chen, Ye ^a   McIntyre, Paul C ^a  

^a Stanford University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; ELECTRODES; FERROELECTRIC MATERIALS; PLATINUM; THIN FILMS; ZIRCONIUM COMPOUNDS;

ELECTRODE PROCESSING; IRIDIUM OXIDE; SWITCHING RELIABILITY;

CHEMICAL STABILITY;

EID: 36849002801     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2822419     Document Type: Article

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