Non-destructive characterization of In/Ag and In/Cu diffusive layers

Journal of Alloys and Compounds

Volumn 479, Issue 1-2, 2009, Pages 583-588

  Wronkowska, A A ^a   Wronkowski, A ^a   Skowronski L ^a  

^a UNIVERSITY OF TECHNOLOGY AND LIFE SCIENCES   (Poland)

Author keywords

Dielectric function; Interdiffusion in nanoscale solids; Intermetallic compounds; Scanning electron microscopy; Spectroscopic ellipsometry; X ray diffractometry

Indexed keywords

ATOMIC CONCENTRATIONS; COMPLEX DIELECTRIC FUNCTIONS; COMPOSITE LAYERS; DIELECTRIC FUNCTION; DRUDE-LORENTZ MODELS; ELLIPSOMETRIC DATUM; INTERDIFFUSION IN NANOSCALE SOLIDS; INTERMETALLIC COMPOUNDS; MICRO-STRUCTURAL; NON-DESTRUCTIVE CHARACTERIZATIONS; OPTICAL AND ELECTRONIC PROPERTIES; OPTICAL RESISTIVITIES; PHOTON ENERGY RANGES; ROOM TEMPERATURES; SAMPLE COMPOSITIONS; X-RAY DIFFRACTOMETRY;

COPPER; DIFFRACTION; DIFFRACTOMETERS; ELECTRON MICROSCOPES; ELECTRONIC PROPERTIES; MULTILAYERS; NANOSTRUCTURED MATERIALS; OPTICAL MICROSCOPY; OPTICAL MULTILAYERS; SCANNING; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING INTERMETALLICS; SILVER; SPECTROSCOPIC ELLIPSOMETRY; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

INTEGRATED OPTOELECTRONICS;

EID: 67349196045     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2009.01.002     Document Type: Article

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