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Volumn 290-291, Issue , 1996, Pages 518-524
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Quantitative investigation of copper/indium multilayer thin film reactions
a a a b c |
Author keywords
Copper; Differential scanning calorimetry; Indium; Thin film reactions
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Indexed keywords
COMPOSITION EFFECTS;
COPPER;
DIFFERENTIAL SCANNING CALORIMETRY;
GRAIN BOUNDARIES;
INTERFACES (MATERIALS);
MULTILAYERS;
PHASE TRANSITIONS;
PHOTOVOLTAIC CELLS;
SCANNING ELECTRON MICROSCOPY;
SEMICONDUCTING INDIUM;
X RAY DIFFRACTION ANALYSIS;
X RAY PHOTOELECTRON SPECTROSCOPY;
COPPER INDIUM DISELENIDE (CIS);
SEMICONDUCTING FILMS;
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EID: 13544251700
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/S0040-6090(96)09027-X Document Type: Article |
Times cited : (17)
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References (13)
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