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Volumn 2, Issue , 2006, Pages 1600-1603

Properties of microcrystalline silicon prepared at high growth rate

Author keywords

[No Author keywords available]

Indexed keywords

FILM GROWTH; HYDROGEN; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SOLAR CELLS; THIN FILMS; TRANSPORT PROPERTIES;

EID: 41749084142     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/WCPEC.2006.279792     Document Type: Conference Paper
Times cited : (2)

References (9)
  • 2
    • 2942590651 scopus 로고    scopus 로고
    • Preparation of microcrystalline silicon films at ultra high-rate of 10 nm/s using high-density plasma
    • Ch. Niikura, M. Kondo and A. Matsuda, "Preparation of microcrystalline silicon films at ultra high-rate of 10 nm/s using high-density plasma", J. of Non-Cryst. Sol. 338-340, 2004, pp. 42-46.
    • (2004) J. of Non-Cryst. Sol , vol.338-340 , pp. 42-46
    • Niikura, C.1    Kondo, M.2    Matsuda, A.3
  • 3
    • 41749117511 scopus 로고    scopus 로고
    • J. Kocka, T. Mates, M. Ledinský, K. Luterová, H. Stuchlíková, J. Stuchlík, A. Porubá, A. Fejfar, Properties of microcrystalline silicon prepared at high growth rate and the new way how to increase nucleation, 3DV.3.30, Proc.of the 20th EPVSEC, Barcelona, Spain, 2005.
    • J. Kocka, T. Mates, M. Ledinský, K. Luterová, H. Stuchlíková, J. Stuchlík, A. Porubá, A. Fejfar, "Properties of microcrystalline silicon prepared at high growth rate and the new way how to increase nucleation", 3DV.3.30, Proc.of the 20th EPVSEC, Barcelona, Spain, 2005.
  • 4
    • 41749101960 scopus 로고    scopus 로고
    • J. Kocka, T. Mates, M. Ledinský, H. Stuchlíková, J. Stuchlík,A. Fejfar, Transport properties of micro-crystalline silicon, prepared at high growth rate, TP3.9, Proc. of the ICANS, Lisbon, September 2005, to be published in J. of Non-Cryst. Sol., 2006.
    • J. Kocka, T. Mates, M. Ledinský, H. Stuchlíková, J. Stuchlík,A. Fejfar, "Transport properties of micro-crystalline silicon, prepared at high growth rate", TP3.9, Proc. of the ICANS, Lisbon, September 2005, to be published in J. of Non-Cryst. Sol., 2006.
  • 5
    • 2942562352 scopus 로고    scopus 로고
    • Creation of metastable defects in microcrystalline silicon films by keV electron irradiation
    • M. V. Chukichev, P. A. Forsh, W. Fuhs, A. G. Kazanskii, "Creation of metastable defects in microcrystalline silicon films by keV electron irradiation", J. of Non-Cryst. Sol. 338-340, 2004, pp. 378-381.
    • (2004) J. of Non-Cryst. Sol , vol.338-340 , pp. 378-381
    • Chukichev, M.V.1    Forsh, P.A.2    Fuhs, W.3    Kazanskii, A.G.4
  • 7
    • 0032066017 scopus 로고    scopus 로고
    • Correlation between structure and optoelectronic properties of undoped microcrystalline silicon
    • F. Siebke, S. Yata, Y. Hishikawa, M. Tanaka, "Correlation between structure and optoelectronic properties of undoped microcrystalline silicon", J. of Non-Cryst. Sol. 227-230, 1998, pp. 977.
    • (1998) J. of Non-Cryst. Sol , vol.227-230 , pp. 977
    • Siebke, F.1    Yata, S.2    Hishikawa, Y.3    Tanaka, M.4
  • 9
    • 0035382302 scopus 로고    scopus 로고
    • New approach to surface photovoltage measurements on hydrogenated microcrystalline silicon layers
    • V. Švrcek, I. Pelant, J. Kocka, A. Fejfar, J. Toušek, M. Kondo, A. Matsuda, "New approach to surface photovoltage measurements on hydrogenated microcrystalline silicon layers", Phil. Mag. Letters 81, 2001, pp. 405-410
    • (2001) Phil. Mag. Letters , vol.81 , pp. 405-410
    • Švrcek, V.1    Pelant, I.2    Kocka, J.3    Fejfar, A.4    Toušek, J.5    Kondo, M.6    Matsuda, A.7


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.