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Volumn 46, Issue 1-2, 2009, Pages 176-181

Electrical characterization of nonvolatile memory with SnO2 nano-particle in polyimide dielectric layer

Author keywords

Nano particles; NFGM; Nonvolatile memory; Polyimide; SnO2

Indexed keywords

AVERAGE DIAMETER; DIELECTRIC LAYER; ELECTRICAL CHARACTERISTIC; ELECTRICAL CHARACTERIZATION; FOWLER-NORDHEIM TUNNELING; MEMORY WINDOW; NFGM; NON-VOLATILE MEMORIES; NONVOLATILE MEMORY; P-TYPE; PARTICLE DENSITIES; POLYMER LAYERS; RETENTION PROPERTIES; SELF-ASSEMBLED; SILION-ON-INSULATOR WAFERS; SNO2; SPHERICAL SHAPE; SUBTHRESHOLD; THRESHOLD VOLTAGE SHIFTS;

EID: 67249155711     PISSN: 07496036     EISSN: 10963677     Source Type: Journal    
DOI: 10.1016/j.spmi.2009.01.002     Document Type: Article
Times cited : (9)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.