The micro-imaging station of the TopoTomo beamline at the ANKA synchrotron light source

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 267, Issue 11, 2009, Pages 1978-1988

  Rack, A ^a   Weitkamp, T ^a   Bauer Trabelsi, S ^a   Modregger, P ^a   Cecilia, A ^a   dos Santos Rolo, T ^a   Rack, T ^a   Haas, D ^a   Simon, R ^a   Heldele, R ^a   Schulz, M ^a   Mayzel, B ^b   Danilewsky, A N ^c   Waterstradt, T ^d   Diete, W ^d   Riesemeier, H ^e   Muller B R ^e   Baumbach, T ^a  

^a KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

^b TEL AVIV UNIVERSITY   (Israel)

^c UNIVERSITY OF FREIBURG   (Germany)

^d ACCEL Instruments GmbH   (Germany)

^e BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

Author keywords

Analyzer based imaging; Bragg magnification; Coherent imaging; Micro tomography; Scintillator; Synchrotron instrumentation; Synchrotron CT; X ray phase contrast; X ray topography

Indexed keywords

ANALYZER-BASED IMAGING; BRAGG MAGNIFICATION; COHERENT IMAGING; MICRO-TOMOGRAPHY; SCINTILLATOR; SYNCHROTRON INSTRUMENTATION; SYNCHROTRON-CT; X-RAY PHASE CONTRAST; X-RAY TOPOGRAPHY;

CAMERAS; CHARGE COUPLED DEVICES; DETECTORS; ENGINEERING GEOLOGY; IMAGE RESOLUTION; LIGHT; LIGHT SOURCES; LUMINESCENCE; PIXELS; READOUT SYSTEMS; SCINTILLATION; SCINTILLATION COUNTERS; SYNCHROTRON RADIATION; SYNCHROTRONS; TOMOGRAPHY; X RAYS;

SEMICONDUCTING INDIUM COMPOUNDS;

EID: 66049156164     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2009.04.002     Document Type: Article

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