Contrast and resolution in imaging with a microfocus x-ray source

Review of Scientific Instruments

Volumn 68, Issue 7, 1997, Pages 2774-2782

  Pogany, A ^a   Gao, D ^a   Wilkins, S W ^a  

^a CSIRO   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000292076     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1148194     Document Type: Article

References (46)

1. M. Born and E. Wolf, Principles of Optics, 6th ed. (Pergamon, Oxford, 1980).
2. J. M. Cowley, Diffraction Physics, 3rd ed. (North Holland, Amsterdam 1995).
3. J. C. H. Spence, Experimental High-Resolution Electron Microscopy, 2nd ed. (Oxford University Press, New York, 1988).
4. U. Bonse and M. Hart, Appl. Phys. Lett. 6, 155 (1965).
5. M. Ando and S. Hosoya, in Proceedings of the International Conference of X-Ray Optics and Microanalysis, edited by G. Shinoda, K. Kohra and T. Ichinokawa (University of Tokyo Press, Tokyo 1972), p. 63.
6. A. Momose, Nucl. Instrum. Methods Phys. Res. A 352, 622 (1995).
7. E. Forster, K. Goetz, and P. Zaumseil, Krist. Tech. 15, 937 (1980).
8. T. J. Davis, D. Gao, T. E. Gureyev, A. W. Stevenson, and S. W. Wilkins, Nature 373, 595 (1995).
9. D. Gao, T. J. Davis, and S. W. Wilkins, Aust. J. Phys. 48, 103 (1995).
10. V. N. Ingal and E. A. Beliaevskaya, J. Phys. D 28, 2314 (1995).
11. G. Schmahl, D. Rudolph, and P. Guttman in X-Ray Microscopy II, edited by D. Sayre, M. Howells, J. Kirz, and H. Rarback (Springer, Berlin, 1988), p. 228.
12. G. Schmahl, D. Rudolph, G. Schneider, P. Guttman, and B. Niemann, Optik (Stuttgart) 97, 181 (1994).
13. Y. M. Hartman and A. A. Snigirev, in X-Ray Microscopy IV, edited by V. V. Aristov and A. I. Erko (Bogorodsky, Moscow, 1994), p. 429.
14. A. Snigirev, I. Snigireva, V. Kohn, S. Kuznetsov, and I. Schelokov, Rev. Sci. Instrum. 66, 5486 (1995).
15. P. Cloetens, R. Barrett, J. Baruchel, J.-P. Guigay, and M. Schlenker, J. Phys. D 29, 133 (1996).
16. S. W. Wilkins, T. E. Gureyev, D. Gao, A. Pogany, and A. W. Stevenson, Nature (London) 384, 335 (1996); S. W. Wilkins, Aust. Patent Application PN2112/95; PCT Patent Application PCT/AU96/00178 (1996).
17. S. W. Wilkins, T. E. Gureyev, D. Gao, A. Pogany, and A. W. Stevenson, Nature (London) 384, 335 (1996); S. W. Wilkins, Aust. Patent Application PN2112/95; PCT Patent Application PCT/AU96/00178 (1996).
18. D. Gabor, Nature (London) 161, 777 (1948).
19. A. Baez, J. Opt. Soc. Am. 42, 756 (1952).
20. S. Kikuta, S. Aoki, S. Kosaki, and K. Kohra, Opt. Commun. 5, 86 (1972).
21. S. Aoki, Y. Ichihara, and S. Kikuta, Jpn. J. Appl. Phys. 11, 1857 (1972).
22. S. Aoki and S. Kikuta, Jpn. J. Appl. Phys. 13, 1385 (1974).
23. B. Reuter and H. Mahr, J. Phys. E 9, 746 (1976).
24. V. V. Aristov and G. A. Ivanova, J. Appl. Crystallogr. 12, 19 (1974).
25. V. V. Aristov, G. A. Bashkina, and A. I. Erko, Opt. Commun. 34, 332 (1980).
26. J. C. Solem and G. C. Baldwin, Science 218, 229 (1982).
27. M. R. Howells, in X-ray Microscopy, edited by G. Schmahl and D. Rudolph (Springer, Berlin, 1984), p. 318.
28. M. R. Howells, M. A. Iarocci, and J. Kirz, J. Opt. Soc. Am. A 3, 2171 (1986).
29. M. R. Howells, C. Jacobsen, J. Kirz, R. Feder, K. McQuaid, and S. Rothman, Science 238, 514 (1987).
30. J. E. Trebes, S. B. Brown, E. M. Campbell, D. L. Mathews, D. G. Nilson, G. F. Stone, and D. A. Whelan, Science 238, 517 (1987).
31. D. Joyeux, S. Lowenthal, F. Polack, and A. Bernstein, in Ref. 11, p. 246.
32. C. Jacobsen, J. Kirz, M. R. Howells, K. McQuaid, S. Rothman, R. Feder, and D. Sayre, in Ref. 11, p. 253.
33. M. R. Howells, in Ref. 11, p. 263.
34. C. Jacobsen, M. R. Howells, J. Kirz, and S. Rothman, J. Opt. Soc. Am. A 7, 1847 (1990).
35. I. McNulty, J. Kirz, C. Jacobsen, E. H. Anderson, M. R. Howells, and D. P. Kern, Science 256, 1009 (1992).
36. I. McNulty, Nucl. Instrum. Methods Phys. Res. A 347, 170 (1994).
37. G. Liu and P. D. Scott, J. Opt. Soc. Am. A 4, 159 (1987).
38. R. P. Millane, J. Opt. Soc. Am. A 7, 394 (1990).
39. M. Nieto-Vesperinas, Scattering and Diffraction in Physical Optics (Wiley, New York, 1991).
40. T. E. Gureyev, A. Roberts, and K. A. Nugent, J. Opt. Soc. Am. A 12, 1932 (1995).
41. V. E. Coslett, A. Engstrom, and H. H. Pattee, X-Ray Microscopy and Microradiography (Academic, New York, 1957).
42. V. E. Coslett and W. C. Nixon, X Ray Microscopy (Cambridge University Press, 1960).
43. J. M. Cowley and A. F. Moodie, Proc. R. Soc. London 76, 378 (1960).
44. J-P. Guigay, Optik (Stuttgart) 49, 121 (1977).
45. S. C. Bushong, Radiologic Science for Technologists, 4th ed. (C. V. Mosby, St. Louis, Missouri, 1988).
46. C. Raven, A. Snigirev, I. Snigireva, P. Spanne, A. Souvorov, and V. Kohn, Appl. Phys. Lett. 69, 1826 (1996).