The high-resolution synchrotron-based imaging stations at the BAMline (BESSY) and TopoTomo (ANKA)

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7078, Issue , 2008, Pages

  Rack, Alexander ^a   Riesemeier, Heinrich ^b   Zabler, Simon ^c   Weitkamp, Timm ^a,d   Müller, Bernd R ^b   Weidemann, Gerd ^b   Modregger, Peter ^a   Banhart, John ^e   Helfen, Lukas ^a   Danilewsky, Andreas N ^f   Gräber, Hans G ^g   Heldele, Richard ^a   Mayzel, Boaz ^h   Goebbels, Jürgen ^b   Baumbach, Tilo ^a  

^a KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

^b BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

^c MAX PLANCK INSTITUTE OF COLLOIDS AND INTERFACES   (Germany)

^d EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^e HAHN MEITNER INSTITUT   (Germany)

^f UNIVERSITY OF FREIBURG   (Germany)

^g RWTH AACHEN UNIVERSITY   (Germany)

^h TEL AVIV UNIVERSITY   (Israel)

Author keywords

Bragg magnification; Coherent imaging; Holotomography; Microtomography; Non destructive evaluation; Scintillator; Synchrotron instrumentation; Synchrotron CT; X ray phase contrast; X ray refraction; X ray topography

Indexed keywords

APPLICATIONS; CAMERAS; CHARGE COUPLED DEVICES; DIAGNOSTIC RADIOGRAPHY; DIGITAL ARITHMETIC; ENGINEERING GEOLOGY; IMAGE RESOLUTION; IMAGING SYSTEMS; LIGHT; LIGHT EMISSION; LIGHT SOURCES; LIGHTING; LUMINESCENCE; MEDICAL IMAGING; OPTICAL SYSTEMS; PHOTONS; PIXELS; READOUT SYSTEMS; REFRACTION; SCINTILLATION; SCINTILLATION COUNTERS; SEMICONDUCTING INDIUM COMPOUNDS; SYNCHROTRONS; THICKNESS MEASUREMENT; TOMOGRAPHY; VEGETATION; X RAY OPTICS; X RAYS;

BRAGG MAGNIFICATION; COHERENT IMAGING; HOLOTOMOGRAPHY; MICROTOMOGRAPHY; NON-DESTRUCTIVE EVALUATION; SCINTILLATOR; SYNCHROTRON INSTRUMENTATION; X-RAY PHASE CONTRAST; X-RAY REFRACTION; X-RAY TOPOGRAPHY;

ELECTROMAGNETIC WAVES;

EID: 56249138621     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.793721     Document Type: Conference Paper

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