BAMline: The first hard X-ray beamline at BESSY II

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 467-468, Issue , 2001, Pages 703-706

  Gorner W ^a   Hentschel, M P ^a   Muller B R ^a   Riesemeier, H ^a   Krumrey, M ^b   Ulm, G ^b   Diete, W ^c   Klein, U ^c   Frahm, R ^d  

^a BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

^b PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

^c ACCEL Instruments GmbH   (Germany)

^d UNIVERSITY OF WUPPERTAL   (Germany)

Author keywords

Detector calibration; Double Crystal Monochromator with sagittal bender; Double Multilayer Monochromator with meridional bender; Micro computed tomography; Reflectometry; X ray fluorescence analysis; X ray topography

Indexed keywords

COMPUTERIZED TOMOGRAPHY; FLUORESCENCE; REFLECTOMETERS; X RAY OPTICS;

HARD X RAY BEAMLINES;

MONOCHROMATORS;

EID: 0035928285     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(01)00466-1     Document Type: Conference Paper

References (7)