Lamellar ferroelectric domains in PbTiO3 grains imaged and manipulated by AFM

Surface Science

Volumn 532-535, Issue , 2003, Pages 483-487

  Loppacher, Ch ^a   Schlaphof, F ^a   Schneider, S ^a   Zerweck, U ^a   Grafstrom S ^a   Eng, L M ^a   Roelofs, A ^b   Waser, R ^b  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

^b RWTH AACHEN UNIVERSITY   (Germany)

Author keywords

Atomic force microscopy; Grain boundaries; Polycrystalline thin films; Surface stress

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL ORIENTATION; CRYSTAL STRUCTURE; EPITAXIAL GROWTH; FERROELECTRIC MATERIALS; GRAIN BOUNDARIES; LEAD COMPOUNDS; POLARIZATION; POLYCRYSTALLINE MATERIALS; STRESS ANALYSIS;

PIEZORESPONSE FORCE MICROSCOPY;

THIN FILMS;

EID: 0037846222     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(03)00184-5     Document Type: Conference Paper

References (16)

1. Binnig G., Quate C.F., Gerber C. Atomic force microscopy. Phys. Rev. Lett. 56(9):1986;930-933.
2. Gruverman A., Auciello O., Tokumoto H. Scanning force microscopy for the study of domain structure in ferroelectric thin films. J. Vac. Sci. Technol. B. 14:1996;602.
3. 3 thin films. Philos. Mag. A. 71(3):1995;713-724.
4. J. Scott, Ferroelectric Memories, first ed., Advanced Microelectronics, Springer, Berlin, Heidelberg, New York, 2000.
5. Tybell T., Ahn C., Triscone J.-M. Ferroelectricity in thin perovskite films. Appl. Phys. Lett. 75(6):1999;856.
6. 3 thin film capacitors. Jpn. J. Appl. Phys. 38(9B):1999;5305.
7. Ganpule C., Stanishevsky A., Su Q., Aggarwal S., Melngailis J., Williams E., Ramesh R. Scaling of ferroelectric properties in thin films. Appl. Phys. Lett. 75(3):1999;409.
8. Tiedke S., Schmitz T., Prume K., Roelofs A., Schneller T., Kall U., Waser R., Ganpule C., Nagarajan V., Stanishevsky A., Ramesh R. Direct hysteresis measurements of single nanosized ferroelectric capacitors contacted with an atomic force microscope. Appl. Phys. Lett. 79(22):2001;3678.
9. Gruverman A., Tokumoto H., Prakash A., Aggarwal S., Yang B., Wuttig M., Ramesh R., Auciello O., Venkatesan T. Nanoscale imaging of domain dynamics and retention in ferroelectric thin films. Appl. Phys. Lett. 71(24):1997;3492.
10. Kwak B., Erbil A., Budai J., Chisholm M., Boatner L., Wilkens B. Domain formation and strain relaxation in epitaxial ferroelectric heterostructures. Phys. Rev. B. 49(21):1994;14865.
11. Streiffer S., Parker C.B., Romanov A., Lefevre M., Zhao L., Speck J., Pompe W., Foster C., Bai G. Domain patterns in epitaxial rhombohedral ferroelectric films. i. geometry and experiments. J. Appl. Phys. 83:1998;2742.
12. Romanov A., Lefevre M., Speck J., Pompe W., Streiffer S., Foster C. Domain pattern formation in epitaxial rhombohedral ferroelectric films. ii. interfacial defects and energetics. J. Appl. Phys. 83(5):1998;2754.
13. Koukhar V., Pertsev N., Waser R. Thermodynamic theory of epitaxial ferroelectric thin films with dense domain structures. Phys. Rev. B. 64:2001;214103.
14. Bolten D., Hoffmann M., Hasenkox U., Lohse O., Waser R. Ferroelectrics. 225:1999;117.
15. Wouters D., Nroga G., Maes H. Mater. Res. Soc. Symp. Proc. 541:1999;381.
16. Roelofs A., Böttger U., Waser R., Schlaphof F., Trogisch S., Eng L. Differentiating 180° and 90° switching of ferroelectric domains with three-dimensional piezoresponse force microscopy. Appl. Phys. Lett. 77(21):2000;3444.