Direct observation of lamellar 90° and 180° domains in single grains of PZT thin film at nanoscale resolution

Physica Status Solidi (A) Applications and Materials Science

Volumn 202, Issue 1, 2005, Pages 158-162

  Yu, H F ^a,b   Zeng, H R ^a   Chu, R Q ^a   Li, G R ^a   Yin, Q R ^a  

^a SHANGHAI INSTITUTE OF CERAMICS   (China)

^b UNIVERSITY OF CHINESE ACADEMY OF SCIENCES   (China)

Author keywords

[No Author keywords available]

Indexed keywords

DOMAIN STRUCTURES; MECHANICAL STRESSES; SCANNING FORCE MICROSCOPY;

FERROELECTRIC MATERIALS; GRAIN SIZE AND SHAPE; LATTICE CONSTANTS; MECHANICAL TESTING; SOL-GELS; SPIN COATING; THIN FILMS;

PIEZOELECTRIC MATERIALS;

EID: 25444445565     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200406901     Document Type: Article

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