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Volumn 11, Issue 4, 2009, Pages 278-284

C60 nanostructures for applications in information technology

Author keywords

[No Author keywords available]

Indexed keywords

BEFORE AND AFTER; CARBON SIGNALS; CRYSTALLINE SILICONS; ISO PROPYL ALCOHOLS; MATRIXES; RESISTIVELY HEATED; SI(1 0 0 ); SILICON RESIDUES; UHV CHAMBERS; ULTRASONIC BATHS; UNDOPED SILICONS;

EID: 64749100260     PISSN: 14381656     EISSN: 15272648     Source Type: Journal    
DOI: 10.1002/adem.200800293     Document Type: Article
Times cited : (4)

References (37)
  • 13
    • 64749109901 scopus 로고    scopus 로고
    • International Technology Roadmap for Semiconductors, ITRS
    • Emerging Research Materials, International Technology Roadmap for Semiconductors 2007, ITRS2007.
    • (2007) Emerging Research Materials
  • 30
    • 64749102308 scopus 로고    scopus 로고
    • D. Briggs, M. P. Seah, Practical Surface Analysis 1 of Auger and X-Ray Photoelectron Spectroscopy, 2nd ed., John Wiley & Sons, Chichester 1996.
    • D. Briggs, M. P. Seah, Practical Surface Analysis Vol. 1 of Auger and X-Ray Photoelectron Spectroscopy, 2nd ed., John Wiley & Sons, Chichester 1996.
  • 34
    • 0014800514 scopus 로고
    • W. Kern, RCA Rev. 1970, 31, 187.
    • (1970) RCA Rev , vol.31 , pp. 187
    • Kern, W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.