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Volumn 602, Issue 2, 2008, Pages 493-498

Epitaxial silicon overgrowth of C60 on the Si(1 0 0)-2 × 1 surface

Author keywords

C60; Epitaxy; Fullerene; Scanning tunneling microscopy; Si(1 0 0) 2 1; Silicon

Indexed keywords

CRYSTAL STRUCTURE; EPITAXIAL GROWTH; MONOLAYERS; SCANNING TUNNELING MICROSCOPY; SILICON;

EID: 38349190313     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2007.10.043     Document Type: Article
Times cited : (5)

References (34)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.