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Volumn 602, Issue 2, 2008, Pages 493-498
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Epitaxial silicon overgrowth of C60 on the Si(1 0 0)-2 × 1 surface
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Author keywords
C60; Epitaxy; Fullerene; Scanning tunneling microscopy; Si(1 0 0) 2 1; Silicon
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Indexed keywords
CRYSTAL STRUCTURE;
EPITAXIAL GROWTH;
MONOLAYERS;
SCANNING TUNNELING MICROSCOPY;
SILICON;
CRATER DIMINUTION;
CRATER FORMATION;
CRYSTAL MORPHOLOGY;
FULLERENES;
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EID: 38349190313
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/j.susc.2007.10.043 Document Type: Article |
Times cited : (5)
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References (34)
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