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Volumn 476, Issue 1-2, 2009, Pages 199-206

Development of high strength Sn-Cu solder using copper particles at nanolength scale

Author keywords

Mechanical properties; Microstructure; Powder metallurgy; Sintering

Indexed keywords

CO-EFFICIENT OF THERMAL EXPANSIONS; COPPER PARTICLES; DENSE MATERIALS; DOMINATING FACTORS; EQUIAXED GRAINS; HIGH STRENGTHS; INTERMETALLIC COMPOUNDS; MICROWAVE SINTERING; PURE SN; SN-CU SOLDERS; ULTIMATE TENSILE STRENGTHS; YIELD STRENGTHS;

EID: 64549097659     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2008.09.061     Document Type: Article
Times cited : (47)

References (47)
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    • F. Hua, J. Glazer, in: R.K. Mahidhara, D.R. Frear, S.M.L. Sastry, K.L. Liaw, W.L. Winterbottom (Eds.), The Minerals, Metals and Materials Society (1997), pp. 65-74.
  • 17
    • 62249110505 scopus 로고    scopus 로고
    • Powder Metallurgy, doi:10.1179/174329008X284895
    • in press
    • M.E. Alam, M. Gupta, Powder Metallurgy, doi:10.1179/174329008X284895, in press.
    • Alam, M.E.1    Gupta, M.2
  • 20
    • 0004196972 scopus 로고    scopus 로고
    • John Wiley and Sons Inc., New York pp. 68-72, 95-121
    • German R.M. Sintering Theory and Practice (1996), John Wiley and Sons Inc., New York pp. 68-72, 95-121
    • (1996) Sintering Theory and Practice
    • German, R.M.1
  • 37
    • 64549118989 scopus 로고    scopus 로고
    • Properties and Selection: Nonferrous Alloys and Special-purpose Materials, Formarly Tenth Edition, ASM Handbook, 2. ASM, Metal Park, Ohio, 1993, pp. 1110, 1166.
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  • 39
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    • Technical data sheet, Qualitek Group of Companies, Qualitek, Singapore, www.qualitek.com (assessed on July 13, 2008).
    • Technical data sheet, Qualitek Group of Companies, Qualitek, Singapore, www.qualitek.com (assessed on July 13, 2008).
  • 47
    • 62249114930 scopus 로고    scopus 로고
    • P. Babaghorbani, S.M.L. Nai, M. Gupta J. Mater. Sci. Mater. in Electronics, doi:10.1007/s10854-008-9767-1, in press.
    • P. Babaghorbani, S.M.L. Nai, M. Gupta J. Mater. Sci. Mater. in Electronics, doi:10.1007/s10854-008-9767-1, in press.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.