Diffusion and trapping of Mu in the III-V nitrides

Journal of Physics Condensed Matter

Volumn 16, Issue 40, 2004, Pages

  Lichti, R L ^a   Celebi, Y G ^b   Cottrell, S P ^c   Cox, S F J ^c,d   Davis, E A ^e  

^a TEXAS TECH UNIVERSITY   (United States)

^b ISTANBUL UNIVERSITY   (Turkey)

^c RUTHERFORD APPLETON LABORATORY   (United Kingdom)

^d UNIVERSITY COLLEGE LONDON   (United Kingdom)

^e UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; DEFECTS; DIFFUSION; ENTHALPY; HYDROGEN; MOLECULAR DYNAMICS; NITRIDES; RELAXATION PROCESSES;

DEFECT CENTERS; DYNAMIC PROPERTIES; MUONIUM (MU); TRAPPING;

HIGH ENERGY PHYSICS;

EID: 6444232264     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/16/40/016     Document Type: Article

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