Leakage current by Frenkel-Poole emission in Ni/Au Schottky contacts on Al0.83 In0.17 N/AlN/GaN heterostructures

Applied Physics Letters

Volumn 94, Issue 14, 2009, Pages

  Arslan, Engin ^a   Bütün, Serkan ^a   Ozbay, Ekmel ^a  

^a BILKENT UNIVERSITY   (Turkey)

Author keywords

[No Author keywords available]

Indexed keywords

CONTINUUM OF STATE; CURRENT MECHANISMS; CURRENT-VOLTAGE MEASUREMENTS; EMISSION OF ELECTRONS; FRENKEL-POOLE EMISSIONS; HETEROSTRUCTURES; MAIN PROCESS; METAL-SEMICONDUCTOR INTERFACES; REVERSE BIAS; REVERSE CURRENT-VOLTAGE CHARACTERISTICS; SCHOTTKY CONTACTS; SCHOTTKY DIODES; TEMPERATURE DEPENDENTS; TEMPERATURE RANGES; TRAPPED STATE;

ALUMINUM; CRYSTALS; HETEROJUNCTIONS; LEAKAGE CURRENTS; SCHOTTKY BARRIER DIODES;

CURRENT VOLTAGE CHARACTERISTICS;

EID: 64349121091     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3115805     Document Type: Article

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