Investigation on the properties of molecular beam deposited ZnSe films

Thin Solid Films

Volumn 517, Issue 13, 2009, Pages 3667-3671

  Huang, Chia Wei ^a   Weng, Hsuan Mei ^b   Jiang, Yeu Long ^b   Ueng, Herng Yih ^a  

^a NATIONAL SUN YAT SEN UNIVERSITY   (Taiwan)

^b NATIONAL CHUNG HSING UNIVERSITY   (Taiwan)

Author keywords

Glass substrate; Growth rate; MBD; ZnSe

Indexed keywords

BEAM EQUIVALENT PRESSURES; FILM COMPOSITIONS; FULL WIDTH AT HALF-MAXIMUM; GLASS SUBSTRATE; GROWTH CONDITIONS; GROWTH PARAMETERS; HIGH QUALITIES; MBD; MOLECULAR BEAM DEPOSITIONS; PEAK INTENSITIES; PREFERRED ORIENTATIONS; VARIOUS SUBSTRATES; X-RAY DIFFRACTION PATTERNS; ZINC SELENIDE; ZNSE; ZNSE FILMS;

BELT DRIVES; CHEMICAL MODIFICATION; DIFFRACTION; GLASS; HOLOGRAPHIC INTERFEROMETRY; MOLECULAR BEAMS; MOLECULAR DYNAMICS; OPTICAL PROPERTIES; SEMICONDUCTING ZINC COMPOUNDS; SUBSTRATES; X RAY DIFFRACTION ANALYSIS; ZINC;

FILM GROWTH;

EID: 64349089504     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2009.01.085     Document Type: Article

References (47)

1. Haase M.A., Qui J., Depuydt J.M., and Chang H. Appl. Phys. Lett. 59 (1991) 1272
2. Jeon H., Ding J., Patterson W., Nurmikko A.V., Xie W., Grillo D.C., Kobayashi M., and Gunshov R.L. Appl. Phys. Lett. 59 (1991) 3619
3. Juza P., Zajicek H., Sitter H., Helm M., Faschinger W., and Lischka K. Appl. Phys. Lett. 61 (1992) 3133
4. Tafreshi M.J., Balakrishna K., and Dhansekaran R. J. Mater. Sci. 32 (1997) 3517
5. Yoo J.B., Fahrenbuch A.L., and Bube R.H. Solar Cells 31 (1991) 171
6. Powlikowski J.M. Thin Solid Films 127 (1985) 9
7. Nouhi A., and Stirn R.J. Solar Cells 21 (1987) 225
8. Chu T.L., Chu S.S., Chen G., Britt J., Ferekides C., and Wu C.Q. J. Appl. Phys. 71 (1992) 3865
9. Chu T.L., and Chu S.S. Prog. Photovol. Res. Appl. 1 (1993) 31
10. Mizuno K., Kobayashi T., Fujiki F., Okamoto H., Prete P., and Lovergine N. Phys. B 376-377 (2006) 782
11. Ohno Y., Taishi T., Yonenaga I., Ichikawa S., Hirai R., and Takeda S. Phys. B 401-402 (2007) 650
12. Song J.S., Chang J.H., Oh D.C., Kim J.J., Cho M.W., Makino H., Hanada T., and Yao T. J. Cryst. Growth 249 (2003) 128
13. Kuo L.H., Kimura K., Miwa S., Yasuda T., and Yao T. Appl. Phys. Lett. 69 (1996) 1408
14. Hsu C.T. Thin Solid Films 335 (1998) 284
15. Yokoyama M., Chen N.T., and Ueng H.Y. J. Cryst. Growth 212 (2000) 97
16. Khawaja E.E., Durrani S.M.A., Hallak A.B., Salim M.A., and Hussain M.S. J. Phys. D: Appl. Phys. 27 (1994) 1008
17. Riveros G., Gomez H., Henriquez R., Schrebler R., Marotti R.E., and Dalchiele E.A. Sol. Energy Mater. Sol. Cells 70 (2001) 255
18. Hahn B., Pschorr-Schoberer E., Griebl E., Kastner M., and Gebhardt W. J. Cryst. Growth 191 (1998) 65
19. Estrada C.A., Nair P.K., Nair M.T.S., Zingaro R.A., and Meyers E.A. J. Electrochem. Soc. 141 (1994) 802
20. Chaparro A.M., Martinez M.A., Guillen C., Bayon R., Gutierrez M.T., and Herrero J. Thin Solid Films 361-362 (2000) 177
21. Kumaresan R., Ichimura M., and Arai E. Thin Solid Films 414 (2002) 25
22. Sudharsanan R., Greenwald A.C., Vakerlis G., Yoganathan M., Cho H.S., and Kadyk J. IEEE Trans. Nucl. Sci. 45 (1998) 285
23. Pal R., Maiti B., Chaudhuri S., and Pal A.K. Vacuum 46 (1995) 1255
24. Riveros G., Gomez H., Henriquez R., Schrebler R., Marotti R.E., and Dalchiele E.A. Sol. Energy Mater. Sol. Cells 70 (2001) 255
25. Herrero J., Gutierrez M.T., Guillen C., Dona J.M., Martinez M.A., Chaparro A.M., and Bayon R. Thin Solid Films 361-362 (2000) 28
26. Singh M., and Vijay Y.K. Appl. Surf. Sci. 239 (2004) 79
27. Venkatachalam S., Mangalaraj D., Narayandass Sa.K., Kim K., and Yi J. Vacuum 81 (2007) 928
28. Venkatachalam S., Mangalaraj D., and Narayandass Sa.K. Appl. Surf. Sci. 253 (2007) 5137
29. Rusu G.I., Diciu M., Pi{dotless}̂rghie C., and Popa E.M. Appl. Surf. Sci. 253 (2007) 9500
30. Rusu G.I., Ciupina V., Popa M.E., Prodan G., Rusu G.G., and Baban C. J. Non-Cryst. Solids 352 (2006) 1525
31. Venkata Subbaiah Y.P., Prathap P., Devika M., and Ramakrishna Reddy K.T. Phys. B 365 (2005) 240
32. Kale R.B., and Lokhande C.D. Appl. Surf. Sci. 252 (2005) 929
33. Kumar V., Khan K.L.A., Singh G., Sharma T.P., and Hussain M. Appl. Surf. Sci. 253 (2007) 3543
34. P and H Developments Ltd. 85a 'The Shire' Simmondley Village, Glossop, Derbys, SK13 6LS, UK. Email: info@pandhdevelopments.com.
35. ICDD 00-037-1463 and JCPDS 37-1463 for cubic (zinc-blende type) structure; and ICDD 01-080-0008 and JCPDS 15-105 for hexagonal (wurtzite-type) structure.
36. Birkholz M. Thin Film Analysis by X-Ray Scattering (2006), WILEY-VCH 52-54
37. Lakshmikumar S.T., and Rastogi A.C. Thin Solid Films 259 (1995) 150
38. Birkholz M. Thin Film Analysis by X-Ray Scattering (2006), WILEY-VCH 52 pp.
39. Hao H., Yao X., and Wang M. Opt. Mater. 29 (2007) 573
40. Kale R.B., Lokhande C.D., Mane R.S., and Han S.H. Appl. Surf. Sci. 252 (2006) 5768
41. Badr Y., and Mahmoud M.A. Spectrochim. Acta, Part A 65 (2006) 584
42. Curie D., and Prener J.S. Physics and Chemistry of II-VI Compounds (1967), North-Holland Publ., Amsterdam Chap. 9 445 pp.
43. Manar A., Chergui A., Guennani D., Ohlmann D., Cloitre T., and Aulombard R.L. Mater. Sci. Eng. B43 (1997) 121
44. Pirzer M., Lux-Steiner M.Ch., and Bucher E. Appl. Phys. A, 54 (1992) 455
45. Hizema N., Kalboussia A., Adhirib R., and Souifi A. Microelectron. J. 38 (2007) 496
46. Potts J.E., Cheng H., Mohapatra S., and Smith T.L. J. Appl. Phys. 61 (1987) 333
47. Bousquet V., Ongaretto C., Laügt M., Behringer M., Tournié E., and Faurie J.P. J. Appl. Phys. 81 (1997) 7012