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Solar Energy Materials and Solar Cells

Volumn 70, Issue 3, 2001, Pages 255-268

Electrodeposition and characterization of ZnSe semiconductor thin films

(6) Riveros, G a Gomez H a Henriquez R a Schrebler, R a Marotti, R E b Dalchiele, E A b

a PONTIFICIA UNIVERSIDAD CATÓLICA DE VALPARAÍSO (Chile)

b INSTITUTO DE FÍSICA (Uruguay)

Author keywords

Electrodeposition; Optical reflectance; X ray diffraction; ZnSe

Indexed keywords

ELECTRODEPOSITION; LIGHT REFLECTION; PHOTOCHEMICAL REACTIONS; RAPID THERMAL ANNEALING; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING FILMS; SUBSTRATES; X RAY DIFFRACTION ANALYSIS; ZINC COMPOUNDS;

SEMICONDUCTOR THIN FILMS;

THIN FILMS;

EID: 0035980895 PISSN: 09270248 EISSN: None Source Type: Journal
DOI: 10.1016/S0927-0248(01)00066-6 Document Type: Article

Times cited : (114)

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