Structural, optical properties and VCNR mechanisms in vacuum evaporated iodine doped ZnSe thin films

Applied Surface Science

Volumn 253, Issue 11, 2007, Pages 5137-5142

  Venkatachalam, S ^a   Mangalaraj, D ^a   Narayandass, Sa K ^a  

^a BHARATHIAR UNIVERSITY   (India)

Author keywords

I V; Optical; RBS; Vacuum evaporation; XRD; ZnSe thin films

Indexed keywords

ALUMINUM COMPOUNDS; ELLIPSOMETRY; OPTICAL PROPERTIES; RUTHERFORD BACKSCATTERING SPECTROSCOPY; VACUUM APPLICATIONS; ZINC COMPOUNDS;

VACUUM EVAPORATION; X-RAY DIFFRACTOGRAMS; ZNSE THIN FILMS;

THIN FILMS;

EID: 33847397849     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2006.11.028     Document Type: Article

References (30)

1. Boney C., Yu Z., Rowland Jr. W.H., Hughes W.C., Cook Jr. J.C., Schetzina J.F., Cantwell G., and Harsch W.C. J. Vac. Sci. Technol. B 14 3 (1996) 2259
2. Shirakawa T. Mater. Sci. Eng. B 91-92 (2002) 470-475
3. Rumberg A., Sommerhalter Ch., Toplak M., Jager-waldau A., and Lux-Steiner M.Ch. Thin Solid Films 361-362 (2000) 172-176
4. Joint committee on Powder Diffraction Standards, File No. 9-387 (1990) (XRD).
5. Coutts T.J. Active and Passive Thin Film Devices (1978), Academic press, London p. 266
6. Rusu G.I., Popa M.E., Rusu G.G., and Iulia S. Appl. Surf. Sci. 218 (2003) 222-230
7. Soliman L.I., and Zayed H.A. Fiz. A 5 4 (1995) 197-204
8. Kikuchi M., et al. Proceedings of the First Conference Solid State Device, Tokyo 1969. J. Jpn. Soc. Appl. Phys. 39 (1970) 203
9. Shimakawa K., Nitta S., and Inagaki Y. Jpn. J. Appl. Phys. 10 (1971) 391-392
10. Hada T., Wasa K., and Hayakawa S. Jpn. J. Appl. Phys. 10 (1971) 521-522
11. Patel S.M., and Patel N.G. Thin Solid Films 122 (1984) 297-304
12. Newbury D.M., and Kirk D.L. Microelectronics 6 (1974) 17
13. Kirk D.L., and Newbury D.M. Microelectronics 5 (1973) 2
14. Jamieson D.N. Nucl. Instrum. Methods B 136-138 (1998) 1-13
15. Doolittle L.R. Nucl. Instrum. Methods B 9 3 (1985) 344-351
16. Warren B.E. X-ray Diffraction (1990), Dover, New York p. 253
17. Venkatachalam S., RajendraKumar R.T., Mangalaraj D., Narayandass Sa.K., Kim K., and Yi J. Solid State Electron. 48 (2004) 2219-2223
18. De C.K., and Mishra N.K. Ind. J. Phys. 71 (1997) 530
19. Tolansky S. Multiple Beam Interferometry of Surfaces and Films (1948), Oxford University press, Oxford p. 147
20. Venkatachalam S., Mangalaraj D., Narayandass Sa.K., Kim K., and Yi J. Physica B 358 1-4 (2005) 27-35
21. Prabakar K., Venkatachalam S., Jeyachandran Y.L., Narayandass Sa.K., and Mangalaraj D. Mater. Sci. Eng. B 107 (2004) 99-105
22. Shiang J.J., Risbud S.H., and Alivisatos A.P. J. Chem. Phys. 98 (1993) 8432
23. Azzam R.M.A., and Bashara N.M. Ellipsometry and Polarized Light (1984), North-Holland, Amsterdam
24. Prabakar K., Narayandass Sa.K., and Mangalaraj D. J. Alloys Compd. 364 (2004) 23-28
25. Adachi S., and Taguchi T. Phys. Rev. B 43 12 (1991) 9569-9577
26. Walter J.L. Phys. Rev. B 1 (1970) 2661
27. Kim Y.-D., Cooper S.L., Klein M.V., and Jonker B.T. Appl. Phys. Lett. 62 19 (1993) 2387
28. Kim C.C., and Sivananthan S. Phys. Rev. B 53 3 (1996) 1475
29. Kvietkova J., Daniel B., Hetterich M., Schubert M., and Spemann D. Thin Solid Films 445-456 (2004) 228-230
30. Harbeke G. In: Abeles F. (Ed). Optical Properties of Solids (1972), North Holland, Amsterdam 21