Preparation and characterization of Zn-Se bilayer thin film structure

Applied Surface Science

Volumn 239, Issue 1, 2004, Pages 79-86

  Singh, M ^a   Vijay, Y K ^a  

^a UNIVERSITY OF RAJASTHAN   (India)

Author keywords

Annealing; Inter diffusion; Optical band gap; RBS; Semiconductor; Thermoelectric power; XRD

Indexed keywords

ANNEALING; CHEMICAL VAPOR DEPOSITION; EPITAXIAL GROWTH; GRAIN SIZE AND SHAPE; LATTICE CONSTANTS; SEMICONDUCTOR MATERIALS; X RAY DIFFRACTION; ZINC COMPOUNDS;

HALOGEN LAMP; INTER-DIFFUSION; OPTICAL BAND GAP; THERMOELECTRIC POWER;

THIN FILMS;

EID: 7544243038     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(04)00614-2     Document Type: Article

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