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Volumn 16, Issue 6, 2009, Pages 89-96

Ab-initio modeling of point defects, impurities and diffusion in silicon

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; DENSITY FUNCTIONAL THEORY; DIMERS; DISSOCIATION; MONOMERS; POINT DEFECTS; SILICON;

EID: 64149129807     PISSN: 19385862     EISSN: 19386737     Source Type: Conference Proceeding    
DOI: 10.1149/1.2980295     Document Type: Conference Paper
Times cited : (2)

References (34)
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    • 0347714184 scopus 로고
    • Defects in Semiconductors II
    • S. Mahajan and J. W. Corbett, Editors, Pittsburgh, PA
    • T. Abe, H. Harada, and J. Chikawa, in Defects in Semiconductors II, S. Mahajan and J. W. Corbett, Editors, PV 14, p. 1, Materials Research Society Proceedings Series, Pittsburgh, PA (1983).
    • (1983) Materials Research Society Proceedings Series , vol.PV 14 , pp. 1
    • Abe, T.1    Harada, H.2    Chikawa, J.3
  • 6
    • 0001675297 scopus 로고    scopus 로고
    • H. Kageshima, A. Taguchi, and K. Wada, Appl. Phys. Lett., 76, 3718 (2000).
    • H. Kageshima, A. Taguchi, and K. Wada, Appl. Phys. Lett., 76, 3718 (2000).
  • 28
    • 27744460065 scopus 로고
    • Phys Rev. B, 49, 14251 (1994).
    • (1994) Phys Rev. B , vol.49 , pp. 14251
  • 30
    • 0001251555 scopus 로고    scopus 로고
    • Phys. Rev. B, 55, 11169 (1996).
    • (1996) Phys. Rev. B , vol.55 , pp. 11169


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.