메뉴 건너뛰기




Volumn 20, Issue 2, 2009, Pages

The metrology of electrical impedance at high frequency: A review

Author keywords

Electrical impedance; Impedance measurement; Metrology; Standards; Traceability

Indexed keywords

CONDENSED MATTER PHYSICS; ELECTRIC IMPEDANCE; MEASUREMENTS; STANDARDS; UNITS OF MEASUREMENT;

EID: 63849213416     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/20/2/022002     Document Type: Article
Times cited : (48)

References (126)
  • 1
    • 85034774347 scopus 로고    scopus 로고
    • Agilent 346-3 Effective impedance measurement using OPEN/SHORT/LOAD correction
    • Agilent 346-3 Effective impedance measurement using OPEN/SHORT/LOAD correction Appl. Note 346-3, Agilent Tech.
    • Appl. Note 346-3, Agilent Tech.
  • 2
    • 0032288248 scopus 로고    scopus 로고
    • Calibration method for four-terminal-pair capacitance standards: Progress report
    • Aoki T, Suzuki K and Yokoi K 1998 Calibration method for four-terminal-pair capacitance standards: progress report CPEM 1998 Conf. Dig. (Washington, DC, 6-10 Jul.) pp 36-7
    • (1998) CPEM 1998 Conf. Dig. , pp. 36-37
    • Aoki, T.1    Suzuki, K.2    Yokoi, K.3
  • 4
    • 0000759684 scopus 로고
    • The design, construction and use of resistors with calculable performance
    • Astbury N F 1935 The design, construction and use of resistors with calculable performance J. IEE 76 389-96
    • (1935) J. IEE , vol.76 , pp. 389-396
    • Astbury, N.F.1
  • 7
    • 2542436780 scopus 로고    scopus 로고
    • Resonance frequency of four terminal-pair air-dielectric capacitance standards and closing the metrological impedance triangle
    • Awan S A, Callegaro L and Kibble B P 2004 Resonance frequency of four terminal-pair air-dielectric capacitance standards and closing the metrological impedance triangle Meas. Sci. Technol. 15 969-72
    • (2004) Meas. Sci. Technol. , vol.15 , Issue.5 , pp. 969-972
    • Awan, S.A.1    Callegaro, L.2    Kibble, B.P.3
  • 8
    • 17444364398 scopus 로고    scopus 로고
    • Towards accurate measurement of the frequency dependence of capacitance and resistance standards up to 10 MHz
    • Awan S A and Kibble B P 2005 Towards accurate measurement of the frequency dependence of capacitance and resistance standards up to 10 MHz IEEE Trans. Instrum. Meas. 54 516-20
    • (2005) IEEE Trans. Instrum. Meas. , vol.54 , Issue.2 , pp. 516-520
    • Awan, S.A.1    Kibble, B.P.2
  • 9
    • 63849203339 scopus 로고    scopus 로고
    • High-frequency calculable impedance standards
    • Awan S A and Kibble B P 2006 High-frequency calculable impedance standards CPEM 2006 Conf. Dig. (Torino, Italy, 9-14 Jul.) pp 650-1
    • (2006) CPEM 2006 Conf. Dig. , pp. 650-651
    • Awan, S.A.1    Kibble, B.P.2
  • 10
    • 34047228023 scopus 로고    scopus 로고
    • A universal geometry for calculable frequency-response coefficient of LCR standards and new 10-MHz resistance and 1.6-MHz quadrature-bridge systems
    • Awan S A and Kibble B P 2007 A universal geometry for calculable frequency-response coefficient of LCR standards and new 10-MHz resistance and 1.6-MHz quadrature-bridge systems IEEE Trans. Instrum. Meas. 56 221-5
    • (2007) IEEE Trans. Instrum. Meas. , vol.56 , Issue.2 , pp. 221-225
    • Awan, S.A.1    Kibble, B.P.2
  • 11
    • 0033689179 scopus 로고    scopus 로고
    • Calibration of IVDs at frequencies up to 1 MHz by permuting capacitors
    • Awan S A, Kibble B P and Robinson I A 2000 Calibration of IVDs at frequencies up to 1 MHz by permuting capacitors IEE Proc., Sci. Meas. Technol. 147 193-5
    • (2000) IEE Proc., Sci. Meas. Technol. , vol.147 , Issue.4 , pp. 193-195
    • Awan, S.A.1    Kibble, B.P.2    Robinson, I.A.3
  • 12
    • 0035306891 scopus 로고    scopus 로고
    • A new four terminal-pair bridge for traceable impedance measurements at frequencies up to 1 MHz
    • Awan S A, Kibble B P, Robinson I A and Giblin S P 2001 A new four terminal-pair bridge for traceable impedance measurements at frequencies up to 1 MHz IEEE Trans. Instrum. Meas. 50 282-5
    • (2001) IEEE Trans. Instrum. Meas. , vol.50 , Issue.2 , pp. 282-285
    • Awan, S.A.1    Kibble, B.P.2    Robinson, I.A.3    Giblin, S.P.4
  • 13
    • 85028527429 scopus 로고
    • Baker-Jarvis J, Janezic M D, Grosvenor J H and Geyer R G 1993 Transmission/reflection and short-circuit line methods for measuring permittivity and permeability Tech. Note 1355-R Electromagnetic Fields Div., Electronics and Electrical Eng. Lab., National Institute for Standards and Technology (NIST) (Boulder, CO, USA, Dec.)
    • (1993) Tech. Note 1355-R
    • Baker-Jarvis, J.1    Janezic, M.D.2    Grosvenor, J.H.3    Geyer, R.G.4
  • 14
    • 0027573677 scopus 로고
    • Impedance spectroscopy of human erythrocytes: System calibration and nonlinear modeling
    • Bao J-Z, Davis C C and Schmukler R E 1993 Impedance spectroscopy of human erythrocytes: system calibration and nonlinear modeling IEEE Trans. Biomed. Eng. 40 364-78
    • (1993) IEEE Trans. Biomed. Eng. , vol.40 , Issue.4 , pp. 364-378
    • Bao, J.-Z.1    Davis, C.C.2    Schmukler, R.E.3
  • 16
    • 33746932896 scopus 로고    scopus 로고
    • Evolution of the 'Guide to the Expression of Uncertainty in Measurement'
    • Bich W, Cox M G and Harris P M 2006 Evolution of the 'Guide to the Expression of Uncertainty in Measurement' Metrologia 43 S161-6
    • (2006) Metrologia , vol.43 , Issue.4
    • Bich, W.1    Cox, M.G.2    Harris, P.M.3
  • 18
    • 63849127238 scopus 로고    scopus 로고
    • Inductively coupled ratio arms for high-frequency bridges
    • Bohacek J 2006 Inductively coupled ratio arms for high-frequency bridges CPEM 2006 Conf. Dig. (Torino, Italy, 9-14 Jul.) pp 470-1
    • (2006) CPEM 2006 Conf. Dig. , pp. 470-471
    • Bohacek, J.1
  • 19
    • 0034870078 scopus 로고    scopus 로고
    • Octofilar resistors with calculable frequency dependence
    • Bohacek J and Wood B M 2001 Octofilar resistors with calculable frequency dependence Metrologia 38 241-7
    • (2001) Metrologia , vol.38 , Issue.3 , pp. 241-247
    • Bohacek, J.1    Wood, B.M.2
  • 20
    • 48349111030 scopus 로고    scopus 로고
    • Numerical computations and measurements on calculable resistance standards based on NiCr thin films
    • Bounouh A 2004 Numerical computations and measurements on calculable resistance standards based on NiCr thin films CPEM 2004 Conf. Dig. (London, 2 Jun.-2 Jul.) pp 370-1 W4c21
    • (2004) CPEM 2004 Conf. Dig. , pp. 370-371
    • Bounouh, A.1
  • 22
    • 27344438720 scopus 로고    scopus 로고
    • Electrical conductivity measurement of metal plates using broadband eddy-current and four-point methods
    • Bowler N and Huang Y 2005 Electrical conductivity measurement of metal plates using broadband eddy-current and four-point methods Meas. Sci. Technol. 16 2193-200
    • (2005) Meas. Sci. Technol. , vol.16 , Issue.11 , pp. 2193-2200
    • Bowler, N.1    Huang, Y.2
  • 23
    • 80052264285 scopus 로고    scopus 로고
    • Calibration of precision step attenuators
    • Bruce B 1998 Calibration of precision step attenuators Proc. NCSL Workshop and Symp. (Albuquerque, NM, USA, 19-23 Jul.)
    • (1998) Proc. NCSL Workshop and Symp.
    • Bruce, B.1
  • 24
    • 0033712720 scopus 로고    scopus 로고
    • High-accuracy voltage and current transmission by a four-coaxial cable
    • Cabiati F and D'Elia V 2000 High-accuracy voltage and current transmission by a four-coaxial cable CPEM 2000 Conf. Dig. (Sydney, NSW, Australia, 14-19 May 2000) pp 435-6
    • (2000) CPEM 2000 Conf. Dig. , pp. 435-436
    • Cabiati, F.1    D'Elia, V.2
  • 25
    • 0036393555 scopus 로고    scopus 로고
    • A new architecture for high-accuracy admittance measuring systems
    • Cabiati F and D'Elia V 2002 A new architecture for high-accuracy admittance measuring systems CPEM 2002 Conf. Dig. pp 178-9
    • (2002) CPEM 2002 Conf. Dig. , pp. 178-179
    • Cabiati, F.1    D'Elia, V.2
  • 26
    • 0016558467 scopus 로고
    • Low frequency transmission errors in multi-coaxial cables and four-port admittance standard definition
    • Cabiati F and D'Emilio S 1975 Low frequency transmission errors in multi-coaxial cables and four-port admittance standard definition Alta Freq. 44 609-16 (319E-326E)
    • (1975) Alta Freq. , vol.44 , Issue.10 , pp. 609-616
    • Cabiati, F.1    D'Emilio, S.2
  • 27
    • 84943311737 scopus 로고    scopus 로고
    • Calibration of impedances by the substitution method: Numerical uncertainty evaluation
    • Callegaro L 2001 Calibration of impedances by the substitution method: numerical uncertainty evaluation Proc. 21st IMEKO TC-4 Symp. (Lisbon, Portugal, 13-14 Sept) pp 481-4
    • (2001) Proc. 21st IMEKO TC-4 Symp. , pp. 481-484
    • Callegaro, L.1
  • 28
    • 4644259709 scopus 로고    scopus 로고
    • Four terminal-pair impedance comparisons at high frequency
    • Callegaro L 2004 Four terminal-pair impedance comparisons at high frequency Proc. IMTC 2004 Instrum. and Meas. Tech. Conf. (Como, Italy, 18-20 May) vol I pp 383-6
    • (2004) Proc. IMTC 2004 Instrum. and Meas. Tech. Conf. , vol.1 , pp. 383-386
    • Callegaro, L.1
  • 29
    • 17444390002 scopus 로고    scopus 로고
    • On strategies for automatic bridge balancing
    • Callegaro L 2005 On strategies for automatic bridge balancing IEEE Trans. Instrum. Meas. 54 529-32
    • (2005) IEEE Trans. Instrum. Meas. , vol.54 , Issue.2 , pp. 529-532
    • Callegaro, L.1
  • 30
    • 63849166003 scopus 로고    scopus 로고
    • S-matrix method for high-frequency calibration of capacitors: Uncertainty evaluation
    • Callegaro L 2006 S-matrix method for high-frequency calibration of capacitors: uncertainty evaluation CPEM 2006 Conf. Dig. (Torino, Italy, 9-14 Jul. 2006) pp 536-7
    • (2006) CPEM 2006 Conf. Dig. , pp. 536-537
    • Callegaro, L.1
  • 31
    • 0036703438 scopus 로고    scopus 로고
    • A remotely controlled coaxial switch for impedance standard calibration
    • Callegaro L, Bosco G C, Capra P P and D'Elia V 2002 A remotely controlled coaxial switch for impedance standard calibration IEEE Trans. Instrum. Meas. 51 628-31
    • (2002) IEEE Trans. Instrum. Meas. , vol.51 , Issue.4 , pp. 628-631
    • Callegaro, L.1    Bosco, G.C.2    Capra, P.P.3    D'Elia, V.4
  • 32
    • 0035720944 scopus 로고    scopus 로고
    • Automated system for inductance realization traceable to ac resistance with a three-voltmeter method
    • Callegaro L and D'Elia V 2001 Automated system for inductance realization traceable to ac resistance with a three-voltmeter method IEEE Trans. Instrum. Meas. 50 1630-3
    • (2001) IEEE Trans. Instrum. Meas. , vol.50 , Issue.6 , pp. 1630-1633
    • Callegaro, L.1    D'Elia, V.2
  • 33
    • 0037390645 scopus 로고    scopus 로고
    • Four terminal-pair impedances and scattering parameters
    • Callegaro L and Durbiano F 2003 Four terminal-pair impedances and scattering parameters Meas. Sci. Technol. 14 523-9
    • (2003) Meas. Sci. Technol. , vol.14 , Issue.4 , pp. 523-529
    • Callegaro, L.1    Durbiano, F.2
  • 34
    • 63849245203 scopus 로고    scopus 로고
    • Progress toward capacitance measurements at ultra-acoustic frequencies
    • Callegaro L and Durbiano F 2004 Progress toward capacitance measurements at ultra-acoustic frequencies CPEM 2004 Conf. Dig. (London, 2 Jun.-2 Jul.) pp 99-100
    • (2004) CPEM 2004 Conf. Dig. , pp. 99-100
    • Callegaro, L.1    Durbiano, F.2
  • 35
    • 63849248906 scopus 로고    scopus 로고
    • Numerical uncertainty evaluation for complex-valued quantities: A case example
    • Callegaro L, Pennecchi F and Bich W 2004 Numerical uncertainty evaluation for complex-valued quantities: a case example Advanced Mathematical and Computational Tools in Metrology vol 6 ed P Ciarlini, M G Cox, F Pavese and G B Rossi (Singapore: World Scientific) pp 274-8 (ISBN 9812389040)
    • (2004) Advanced Mathematical and Computational Tools in Metrology , vol.6 , pp. 274-278
    • Callegaro, L.1    Pennecchi, F.2    Bich, W.3
  • 37
    • 4644250136 scopus 로고
    • A wide range capacitance- conductance bridge
    • Cole R H and Gross P M 1949 A wide range capacitance- conductance bridge Rev. Sci. Instrum. 20 252-60
    • (1949) Rev. Sci. Instrum. , vol.20 , Issue.4 , pp. 252-260
    • Cole, R.H.1    Gross, P.M.2
  • 38
    • 0002414811 scopus 로고
    • Four-terminal-pair networks as precision admittance and impedance standards
    • Cutkosky R D 1964 Four-terminal-pair networks as precision admittance and impedance standards Electron. Commun. 70 19-22
    • (1964) Electron. Commun. , vol.70 , pp. 19-22
    • Cutkosky, R.D.1
  • 40
    • 84937352182 scopus 로고
    • The precision measurement of transformer ratios
    • Cutkosky R D and Shields J Q 1960 The precision measurement of transformer ratios IRE Trans. Instrum. I-9 243-50
    • (1960) IRE Trans. Instrum. , vol.1-9 , pp. 243-250
    • Cutkosky, R.D.1    Shields, J.Q.2
  • 41
    • 0033689917 scopus 로고    scopus 로고
    • Calculable coaxial resistors for precision measurements
    • Elmquist R E 2000 Calculable coaxial resistors for precision measurements IEEE Trans. Instrum. Meas. 49 210-4
    • (2000) IEEE Trans. Instrum. Meas. , vol.49 , Issue.2 , pp. 210-214
    • Elmquist, R.E.1
  • 42
    • 33749038354 scopus 로고    scopus 로고
    • Determination of the Boltzmann constant-status and prospects
    • Fellmuth B, Gaiser Ch and Fischer J 2006 Determination of the Boltzmann constant-status and prospects Meas. Sci. Technol. 17 R145-9
    • (2006) Meas. Sci. Technol. , vol.17 , Issue.10
    • Fellmuth, B.1    Ch, G.2    Fischer, J.3
  • 43
    • 63849298794 scopus 로고
    • Free G M and Jones R N 1992 Calibration service for low-loss, three-terminal capacitance standards at 100 kHz and 1 MHz Tech. note (NIST, Feb. 1992)
    • (1992) Tech. Note
    • Free, G.M.1    Jones, R.N.2
  • 44
    • 0001718564 scopus 로고
    • A design for resistors of calculable a.c./d.c. resistance ratio
    • Gibbings D L H 1963 A design for resistors of calculable a.c./d.c. resistance ratio Proc. Inst. Elec. Eng. 110 335-47
    • (1963) Proc. Inst. Elec. Eng. , vol.110 , pp. 335-347
    • Gibbings, D.L.H.1
  • 45
    • 21344473433 scopus 로고    scopus 로고
    • Traceable measurements of the static permittivity of dielectric reference liquids over the temperature range 5-50° C
    • Gregory A P and Clarke R N 2005 Traceable measurements of the static permittivity of dielectric reference liquids over the temperature range 5-50° C Meas. Sci. Technol. 16 1506-16
    • (2005) Meas. Sci. Technol. , vol.16 , Issue.7 , pp. 1506-1516
    • Gregory, A.P.1    Clarke, R.N.2
  • 46
    • 34247132722 scopus 로고    scopus 로고
    • Dielectric metrology with coaxial sensors
    • Gregory A P and Clarke R N 2007 Dielectric metrology with coaxial sensors Meas. Sci. Technol. 18 1372-86
    • (2007) Meas. Sci. Technol. , vol.18 , Issue.5 , pp. 1372-1386
    • Gregory, A.P.1    Clarke, R.N.2
  • 47
    • 0017269107 scopus 로고
    • A step-up method for calibrating inductive voltage dividers up to 1 MHz
    • Grohmann K 1976 A step-up method for calibrating inductive voltage dividers up to 1 MHz IEEE Trans. Instrum. Meas. IM-25 516-8
    • (1976) IEEE Trans. Instrum. Meas. , vol.999 , Issue.4-25 , pp. 516-518
    • Grohmann, K.1
  • 48
    • 0021444332 scopus 로고
    • Self-calibrating cryo current comparators for ac applications
    • Grohmann K and Hechtfischer D 1984 Self-calibrating cryo current comparators for ac applications IEEE Trans. Instrum. Meas. IM-33 91-6
    • (1984) IEEE Trans. Instrum. Meas. , vol.33 , Issue.2 , pp. 91-96
    • Grohmann, K.1    Hechtfischer, D.2
  • 52
    • 0037344781 scopus 로고    scopus 로고
    • Calculating measurement uncertainty for complex-valued quantities
    • Hall B D 2003 Calculating measurement uncertainty for complex-valued quantities Meas. Sci. Technol. 14 368-75
    • (2003) Meas. Sci. Technol. , vol.14 , Issue.3 , pp. 368-375
    • Hall, B.D.1
  • 53
    • 3042587072 scopus 로고    scopus 로고
    • On the propagation of uncertainty in complex-valued quantities
    • Hall B D 2004a On the propagation of uncertainty in complex-valued quantities Metrologia 41 173-7
    • (2004) Metrologia , vol.41 , Issue.3 , pp. 173-177
    • Hall, B.D.1
  • 54
    • 33744794935 scopus 로고    scopus 로고
    • Monte Carlo uncertainty calculations with small-sample estimates of complex quantities
    • Hall B D 2006 Monte Carlo uncertainty calculations with small-sample estimates of complex quantities Metrologia 43 220-6
    • (2006) Metrologia , vol.43 , Issue.3 , pp. 220-226
    • Hall, B.D.1
  • 55
    • 36749039356 scopus 로고    scopus 로고
    • Some considerations related to the evaluation of measurement uncertainty for complex-valued quantities in radio frequency measurements
    • Hall B D 2007 Some considerations related to the evaluation of measurement uncertainty for complex-valued quantities in radio frequency measurements Metrologia 44 L62-7
    • (2007) Metrologia , vol.44 , Issue.6
    • Hall, B.D.1
  • 57
    • 0024751570 scopus 로고
    • An improved straddling method with triaxial guards for the calibration of inductive voltage dividers at 1592 Hz
    • Hanke R 1989 An improved straddling method with triaxial guards for the calibration of inductive voltage dividers at 1592 Hz IEEE Trans. Instrum. Meas. 38 974-8
    • (1989) IEEE Trans. Instrum. Meas. , vol.38 , Issue.5 , pp. 974-978
    • Hanke, R.1
  • 58
    • 0010674895 scopus 로고
    • Bestimmung des Frequenzganges von Luftkondensatoren des Typs GR 1403 im Frquenzbereich von 10 kHz bis 1 MHz
    • Hanke R and Dröge K 1987 Bestimmung des Frequenzganges von Luftkondensatoren des Typs GR 1403 im Frquenzbereich von 10 kHz bis 1 MHz PTB-Mitteilungen 97 377-83 (in German)
    • (1987) PTB-Mitteilungen , vol.97 , pp. 377-383
    • Hanke, R.1    Dröge, K.2
  • 59
    • 0036393545 scopus 로고    scopus 로고
    • Inductance calibration in the frequency range from 50 Hz to 1 MHz at PTB
    • Hanke R, Koelling A and Melcher J 2002 Inductance calibration in the frequency range from 50 Hz to 1 MHz at PTB CPEM 2002 Conf. Dig. pp 186-7
    • (2002) CPEM 2002 Conf. Dig. , pp. 186-187
    • Hanke, R.1    Koelling, A.2    Melcher, J.3
  • 60
    • 1942448410 scopus 로고
    • Theory, design and measurement of inductive voltage dividers
    • Hill J J and Deacon T A 1968 Theory, design and measurement of inductive voltage dividers Proc. IEE 115 727-35
    • (1968) Proc. IEE , vol.115 , pp. 727-735
    • Hill, J.J.1    Deacon, T.A.2
  • 61
    • 63849272157 scopus 로고
    • Lumped parameter impedance measurements
    • Huntley L E and Jones R N 1967 Lumped parameter impedance measurements Proc. IEEE 55 900-11
    • (1967) Proc. IEEE , vol.55 , Issue.6 , pp. 900-911
    • Huntley, L.E.1    Jones, R.N.2
  • 63
    • 63849162741 scopus 로고    scopus 로고
    • JCGM 2008 Supplement 2 to the 'Guide to the Expression of Uncertainty in Measurement'-Models with any number of output quantities in preparation
    • (2008)
    • Jcgm1
  • 64
    • 63849129566 scopus 로고    scopus 로고
    • JCGM 2008 Supplement 3 to the 'Guide to the Expression of Uncertainty in Measurement'-Modelling in preparation
    • (2008)
    • Jcgm1
  • 65
    • 63849245656 scopus 로고
    • Jones R N 1962 A technique for extrapolating the 1 kc values of secondary capacitance standards to higher frequencies (Tech. Note 201, NBS, Nov.)
    • (1962) (Tech. Note 201, NBS, Nov.)
    • Jones, R.N.1
  • 66
    • 63849190245 scopus 로고
    • Jones R N 1980 Evaluation of three-terminal and four-terminal pair capacitors at high frequencies Tech. Note 1024 NBS p 15
    • (1980) Tech. Note 1024 NBS , pp. 15
    • Jones, R.N.1
  • 68
    • 63849161339 scopus 로고    scopus 로고
    • Adapting the ISO GUM for a practical approach to uncertainty calculation of complex numbers
    • Kasuga M, Yamazaki A, Suzuki K and Yokoi K 2002 Adapting the ISO GUM for a practical approach to uncertainty calculation of complex numbers Proc. NCSLI (San Diego, US, Aug.)
    • (2002) Proc. NCSLI
    • Kasuga, M.1    Yamazaki, A.2    Suzuki, K.3    Yokoi, K.4
  • 69
    • 0031701614 scopus 로고    scopus 로고
    • Proposals for extending traceable impedance measurements to higher frequencies
    • Kibble B P 1998 Proposals for extending traceable impedance measurements to higher frequencies Metrologia 35 17-20
    • (1998) Metrologia , vol.35 , Issue.1 , pp. 17-20
    • Kibble, B.P.1
  • 72
    • 63849200200 scopus 로고    scopus 로고
    • Resistance standards with calculable frequency dependence for frequencies up to 1 MHz
    • Kim H J, Lee R D and Semenov Y P 2006 Resistance standards with calculable frequency dependence for frequencies up to 1 MHz CPEM 2006 Conf. Dig. (Torino, Italy, 9-14 Jul.)
    • (2006) CPEM 2006 Conf. Dig.
    • Kim, H.J.1    Lee, R.D.2    Semenov, Y.P.3
  • 73
    • 0036388675 scopus 로고    scopus 로고
    • Determination of the frequency dependence of capacitance standards with ceramic dielectrics
    • Klionsky M D, Semenov Yu P and Moodley A 2002 Determination of the frequency dependence of capacitance standards with ceramic dielectrics CPEM 2002 Conf. Dig. pp 346-7
    • (2002) CPEM 2002 Conf. Dig. , pp. 346-347
    • Klionsky, M.D.1    Semenov Yu, P.2    Moodley, A.3
  • 74
    • 0033687507 scopus 로고    scopus 로고
    • Uncertainty analysis for four-terminal-pair capacitance and dissipation factor characterization at 1 and 10 MHz
    • Koffman A D, Avramov-Zamurovic S, Waltrip B C and Oldham N M 2000 Uncertainty analysis for four-terminal-pair capacitance and dissipation factor characterization at 1 and 10 MHz IEEE Trans. Instrum. Meas. 49 346-8
    • (2000) IEEE Trans. Instrum. Meas. , vol.49 , Issue.2 , pp. 346-348
    • Koffman, A.D.1    Avramov-Zamurovic, S.2    Waltrip, B.C.3    Oldham, N.M.4
  • 76
    • 0000436485 scopus 로고
    • On the theory of dispersion of x-rays
    • Krönig R L 1926 On the theory of dispersion of x-rays J. Opt. Soc. Am. 12 547-57
    • (1926) J. Opt. Soc. Am. , vol.12 , Issue.6 , pp. 547-557
    • Krönig, R.L.1
  • 77
    • 4544322570 scopus 로고    scopus 로고
    • Bioelectrical impedance analysis-part I: Review of principles and methods
    • Kyle U G et al 2004a Bioelectrical impedance analysis-part I: review of principles and methods Clin. Nutr. 23 1226-43
    • (2004) Clin. Nutr. , vol.23 , Issue.5 , pp. 1226-1243
    • Kyle, U.G.1    Al, E.2
  • 78
    • 8744237041 scopus 로고    scopus 로고
    • Bioelectrical impedance analysis-part II: Review of utilization in clinical practice
    • Kyle U G et al 2004b Bioelectrical impedance analysis-part II: review of utilization in clinical practice Clin. Nutr. 23 1430-53
    • (2004) Clin. Nutr. , vol.23 , Issue.6 , pp. 1430-1453
    • Kyle, U.G.1    Al, E.2
  • 81
    • 0028558103 scopus 로고
    • Systematic errors of long thin coaxial cables for the connection of four-terminal-pair devices
    • Melcher J 1994 Systematic errors of long thin coaxial cables for the connection of four-terminal-pair devices CPEM 1994 Conf. Dig. (Boulder, CO, USA) pp 138-9
    • (1994) CPEM 1994 Conf. Dig. , pp. 138-139
    • Melcher, J.1
  • 82
    • 36149072543 scopus 로고
    • A class of double-balance quadrature bridges for the intercomparison of three-terminal resistance, inductance and capacitance standards
    • Millea A and Ilie P 1969 A class of double-balance quadrature bridges for the intercomparison of three-terminal resistance, inductance and capacitance standards Metrologia 5 14-20
    • (1969) Metrologia , vol.5 , Issue.1 , pp. 14-20
    • Millea, A.1    Ilie, P.2
  • 83
    • 85034770815 scopus 로고    scopus 로고
    • A practical system to evaluate the non-linearity of four-terminal-pair (4TP) LCR meter
    • Mitsuo K, Suzuki K and Yamazaki A 2007 A practical system to evaluate the non-linearity of four-terminal-pair (4TP) LCR meter NCSL Conf. Proc. (Saint Paul, MN, 29 Jul.- 2 Aug.) p 7F
    • (2007) NCSL Conf. Proc.
    • Mitsuo, K.1    Suzuki, K.2    Yamazaki, A.3
  • 84
    • 63849103470 scopus 로고
    • A direct-reading current-comparator bridge for scaling four-terminal impedances at audio frequencies
    • Moore W J M and Basu S K 1966 A direct-reading current-comparator bridge for scaling four-terminal impedances at audio frequencies IEEE Trans. Instrum. Meas. IM-15 253-9
    • (1966) IEEE Trans. Instrum. Meas. , vol.15 , Issue.4 , pp. 253-259
    • Moore, W.J.M.1    Basu, S.K.2
  • 85
    • 0141885213 scopus 로고    scopus 로고
    • Generalized adaptive calibration schemes for precision RF vector network analyzer measurement
    • Morgan A G, Ridler N M and Salter M J 2003 Generalized adaptive calibration schemes for precision RF vector network analyzer measurement IEEE Trans. Instrum. Meas. 52 1266-72
    • (2003) IEEE Trans. Instrum. Meas. , vol.52 , Issue.4 , pp. 1266-1272
    • Morgan, A.G.1    Ridler, N.M.2    Salter, M.J.3
  • 86
    • 0024028190 scopus 로고
    • Precision 1 MHz capacitance standards using loss-free-type three-terminal capacitors
    • Nakase T 1988 Precision 1 MHz capacitance standards using loss-free-type three-terminal capacitors CPEM 1988 Conf. Dig. (7-10 Jun.) pp 51-2
    • (1988) CPEM 1988 Conf. Dig. (7-10 Jun.) , pp. 51-52
    • Nakase, T.1
  • 87
    • 33846893450 scopus 로고    scopus 로고
    • Estimation of the modulus of a complex-valued quantity
    • Oberto L and Pennecchi F 2006 Estimation of the modulus of a complex-valued quantity Metrologia 43 531-8
    • (2006) Metrologia , vol.43 , Issue.6 , pp. 531-538
    • Oberto, L.1    Pennecchi, F.2
  • 88
    • 0029741650 scopus 로고    scopus 로고
    • Overview of bioelectrical impedance analyzers
    • Oldham N 1996 Overview of bioelectrical impedance analyzers Am. J. Clin. Nutr. 64 405S-12S
    • (1996) Am. J. Clin. Nutr. , vol.64
    • Oldham, N.1
  • 89
    • 51949085874 scopus 로고    scopus 로고
    • Realization of the henry at METAS
    • Overney F 2008 Realization of the henry at METAS CPEM 2008 Conf. Dig. (Broomfield, CO, USA, 8-13 Jun.) pp 596-7 extended abstract
    • (2008) CPEM 2008 Conf. Dig. , pp. 596-597
    • Overney, F.1
  • 90
    • 33749449266 scopus 로고    scopus 로고
    • The quantized Hall effect: Towards a primary standard of impedance
    • Overney F, Jeanneret B, Jeckelmann B, Wood B M and Schurr J 2006 The quantized Hall effect: towards a primary standard of impedance Metrologia 43 409-13
    • (2006) Metrologia , vol.43 , Issue.5 , pp. 409-413
    • Overney, F.1    Jeanneret, B.2    Jeckelmann, B.3    Wood, B.M.4    Schurr, J.5
  • 91
    • 36248973004 scopus 로고    scopus 로고
    • Four-terminal-pair capacitance characterization at frequencies up to 30 MHz using resonance frequencies
    • zkan T, Gülmez Gülay, Turhan E and Gülmez Y 2007 Four-terminal-pair capacitance characterization at frequencies up to 30 MHz using resonance frequencies Meas. Sci. Technol. 18 3496-500
    • (2007) Meas. Sci. Technol. , vol.18 , Issue.11 , pp. 3496-3500
    • Zkan, T.1    Gülay, G.2    Turhan, E.3    Gülmez, Y.4
  • 93
    • 0035306966 scopus 로고    scopus 로고
    • From the calculable AC resistor to capacitor dissipation factor determination on the basis of time constants
    • Ramm G and Moser H 2001 From the calculable AC resistor to capacitor dissipation factor determination on the basis of time constants IEEE Trans. Instrum. Meas. 50 286-9
    • (2001) IEEE Trans. Instrum. Meas. , vol.50 , Issue.2 , pp. 286-289
    • Ramm, G.1    Moser, H.2
  • 94
    • 0036390105 scopus 로고    scopus 로고
    • An approach to the treatment of uncertainty in complex S-parameter measurements
    • Ridler N M and Salter M J 2002 An approach to the treatment of uncertainty in complex S-parameter measurements Metrologia 39 295-302
    • (2002) Metrologia , vol.39 , Issue.3 , pp. 295-302
    • Ridler, N.M.1    Salter, M.J.2
  • 96
    • 0038575742 scopus 로고    scopus 로고
    • High-frequency thin-film multijunction thermal converter on a quartz crystal chip
    • Scarioni L, Klonz M, Janik D, Laiz H and Kampik M 2003 High-frequency thin-film multijunction thermal converter on a quartz crystal chip IEEE Trans. Instrum. Meas. 52 345-9
    • (2003) IEEE Trans. Instrum. Meas. , vol.52 , Issue.2 , pp. 345-349
    • Scarioni, L.1    Klonz, M.2    Janik, D.3    Laiz, H.4    Kampik, M.5
  • 97
    • 34247250891 scopus 로고    scopus 로고
    • The ac quantum Hall effect as a primary standard of impedance
    • Schurr J, Ahlers F J, Heinand G and Pierz K 2007 The ac quantum Hall effect as a primary standard of impedance Metrologia 44 15-23
    • (2007) Metrologia , vol.44 , Issue.1 , pp. 15-23
    • Schurr, J.1    Ahlers, F.J.2    Heinand, G.3    Pierz, K.4
  • 98
    • 63849137714 scopus 로고    scopus 로고
    • A new design of permuting capacitors device for calibration of 10:1 high-frequency inductive voltage dividers
    • Sedlacek R, Kucera J and Bohacek J 2006 A new design of permuting capacitors device for calibration of 10:1 high-frequency inductive voltage dividers CPEM 2006 Conf. Dig. (Torino, Italy, 9-14 July) pp 476-7
    • (2006) CPEM 2006 Conf. Dig. , pp. 476-477
    • Sedlacek, R.1    Kucera, J.2    Bohacek, J.3
  • 100
    • 0015434672 scopus 로고
    • Phase-angle characteristics of cross capacitors
    • Shields J Q 1972 Phase-angle characteristics of cross capacitors IEEE Trans. Instrum. Meas. IM-21 365-8
    • (1972) IEEE Trans. Instrum. Meas. , vol.21 , Issue.4 , pp. 365-368
    • Shields, J.Q.1
  • 101
    • 21444440433 scopus 로고    scopus 로고
    • Impedance analysis: A powerful method for the determination of the doping concentration and built-in potential of nonideal semiconductor p-n diodes
    • Straub A, Gebs R, Habenicht H, Trunk S, Bardos R A, Sproul A B and Aberle A G 2005 Impedance analysis: a powerful method for the determination of the doping concentration and built-in potential of nonideal semiconductor p-n diodes J. Appl. Phys. 97 083703
    • (2005) J. Appl. Phys. , vol.97 , Issue.8 , pp. 083703
    • Straub, A.1    Gebs, R.2    Habenicht, H.3    Trunk, S.4    Bardos, R.A.5    Sproul, A.B.6    Aberle, A.G.7
  • 102
    • 17444412970 scopus 로고    scopus 로고
    • Uncertainty of VNA S-parameter measurement due to nonideal TRL calibration items
    • Stumper U 2005 Uncertainty of VNA S-parameter measurement due to nonideal TRL calibration items IEEE Trans. Instrum. Meas. 54 676-9
    • (2005) IEEE Trans. Instrum. Meas. , vol.54 , Issue.2 , pp. 676-679
    • Stumper, U.1
  • 103
    • 0026142356 scopus 로고
    • A new universal calibration method for four terminal-pair admittance standards
    • Suzuki K 1991 A new universal calibration method for four terminal-pair admittance standards IEEE Trans. Instrum. Meas. 40 420-2
    • (1991) IEEE Trans. Instrum. Meas. , vol.40 , Issue.2 , pp. 420-422
    • Suzuki, K.1
  • 104
    • 0025435667 scopus 로고
    • A new universal calibration method for four-terminal-pair admittance standards
    • Suzuki K, Aoki T and Yokoi K 1990 A new universal calibration method for four-terminal-pair admittance standards CPEM'90 Conf. Dig. (Ottawa, Canada, 11-14 Jun. 1990) pp 18-9
    • (1990) CPEM'90 Conf. Dig. , pp. 18-19
    • Suzuki, K.1    Aoki, T.2    Yokoi, K.3
  • 105
    • 63849264717 scopus 로고    scopus 로고
    • Non-linearity evaluation method of four-terminal-pair (4TP) LCR meter
    • Suzuki K, Yamazaki A and Yokoi K 2001 Non-linearity evaluation method of four-terminal-pair (4TP) LCR meter NCSL Conf. Proc. (Washington, DC, 29 Jul.-2 Aug.) p 6A
    • (2001) NCSL Conf. Proc.
    • Suzuki, K.1    Yamazaki, A.2    Yokoi, K.3
  • 106
    • 0034833292 scopus 로고    scopus 로고
    • Simplified high accuracy high bandwidth calibration of dielectric capacitors
    • Svetik Z 2001 Simplified high accuracy high bandwidth calibration of dielectric capacitors IMTC2004 Instrumentation and Measurement Tech. Conf. (Budapest, Hungary, 21-23 May) pp 1445-9
    • (2001) IMTC2004 Instrumentation and Measurement Tech. Conf. , pp. 1445-1449
    • Svetik, Z.1
  • 107
    • 0027585840 scopus 로고
    • A calibration method for four terminal-pair high-frequency resistance standards
    • Suzuki K, Aoki T and Yokoi K 1993 A calibration method for four terminal-pair high-frequency resistance standards IEEE Trans. Instrum. Meas. 42 379-84
    • (1993) IEEE Trans. Instrum. Meas. , vol.42 , Issue.2 , pp. 379-384
    • Suzuki, K.1    Aoki, T.2    Yokoi, K.3
  • 108
    • 0033679528 scopus 로고    scopus 로고
    • Evaluation of capacitance and resistance standards at higher frequencies
    • Svetik Z and Lapuh R 2000 Evaluation of capacitance and resistance standards at higher frequencies CPEM 2000 Conf. Dig. (Sydney, NSW, Australia, 14-19 May) pp 642-643
    • (2000) CPEM 2000 Conf. Dig. , pp. 642-643
    • Svetik, Z.1    Lapuh, R.2
  • 109
    • 0027585764 scopus 로고
    • High-accuracy N-port impedance measurements by means of modular digital AC compensators
    • Tarach D and Trenkler G 1993 High-accuracy N-port impedance measurements by means of modular digital AC compensators IEEE Trans. Instrum. Meas. 42 622-6
    • (1993) IEEE Trans. Instrum. Meas. , vol.42 , Issue.2 , pp. 622-626
    • Tarach, D.1    Trenkler, G.2
  • 110
    • 33845949406 scopus 로고
    • An absolute determination of resistance based on a calculable standard of capacitance
    • Thompson A M 1968 An absolute determination of resistance based on a calculable standard of capacitance Metrologia 4 1-7
    • (1968) Metrologia , vol.4 , Issue.1 , pp. 1-7
    • Thompson, A.M.1
  • 111
    • 34548610343 scopus 로고
    • A new theorem in electrostatics and its application to calculable standards of capacitance
    • Thompson A M and Lampard D G 1956 A new theorem in electrostatics and its application to calculable standards of capacitance Nature 177 888
    • (1956) Nature , vol.177 , Issue.4515 , pp. 888
    • Thompson, A.M.1    Lampard, D.G.2
  • 112
    • 0022798058 scopus 로고
    • Application of Kramers-Krönig transforms in the analysis of electrochemical impedance data. II: Transformations in the complex plane
    • Urquidi-Macdonald M, Real S and Macdonald D D 1986 Application of Kramers-Krönig transforms in the analysis of electrochemical impedance data. II: Transformations in the complex plane Electrochem. Soc. 133 2018-24
    • (1986) Electrochem. Soc. , vol.133 , Issue.10 , pp. 2018-2024
    • Urquidi-Macdonald, M.1    Real, S.2    MacDonald, D.D.3
  • 114
    • 33846863384 scopus 로고    scopus 로고
    • Uncertainty analysis for vector measurands using fiducial inference
    • Wang C M and Iyer H K 2006 Uncertainty analysis for vector measurands using fiducial inference Metrologia 43 486-94
    • (2006) Metrologia , vol.43 , Issue.6 , pp. 486-494
    • Wang, C.M.1    Iyer, H.K.2
  • 115
    • 48349137036 scopus 로고    scopus 로고
    • Calibration theory and measurement method of four-terminal-pair standard capacitor frequency characteristic
    • Wang X, Ruan Y, Dai D and Wang Q 2004 Calibration theory and measurement method of four-terminal-pair standard capacitor frequency characteristic CPEM 2004 Conf. Dig. (London, 2 Jun.-2 Jul. W4c24) pp 376-7
    • (2004) CPEM 2004 Conf. Dig. , pp. 376-377
    • Wang, X.1    Ruan, Y.2    Dai, D.3    Wang, Q.4
  • 116
    • 0142071053 scopus 로고    scopus 로고
    • Frequency dependence of capacitance standards
    • Wang Y 2003 Frequency dependence of capacitance standards Rev. Sci. Instrum. 74 4212-5
    • (2003) Rev. Sci. Instrum. , vol.74 , Issue.9 , pp. 4212-4215
    • Wang, Y.1
  • 117
    • 0014884334 scopus 로고
    • Accurate immittance measurements at frequencies up to 20 MHz
    • White L D 1970 Accurate immittance measurements at frequencies up to 20 MHz IEEE Trans. Instrum. Meas. IM-49 331-6
    • (1970) IEEE Trans. Instrum. Meas. , vol.19 , Issue.4 , pp. 331-336
    • White, L.D.1
  • 118
    • 0001147520 scopus 로고
    • Resistors having a calculable performance with frequency
    • Wilkins F J and Swan M J 1969 Resistors having a calculable performance with frequency Proc. IEE 116 318-24
    • (1969) Proc. IEE , vol.116 , pp. 318-324
    • Wilkins, F.J.1    Swan, M.J.2
  • 119
    • 0742304087 scopus 로고    scopus 로고
    • An optimal vector network analyzer calibration algorithm
    • Williams D F, Wang J C M and Arz U 2003 An optimal vector network analyzer calibration algorithm IEEE Trans. Microw. 51 2391-401
    • (2003) IEEE Trans. Microw. , vol.51 , Issue.12 , pp. 2391-2401
    • Williams, D.F.1    Wang, J.C.M.2    Arz, U.3
  • 120
    • 0036944896 scopus 로고    scopus 로고
    • A classical method for uncertainty analysis with multidimensional data
    • Willink R and Hall B D 2002 A classical method for uncertainty analysis with multidimensional data Metrologia 39 361-9
    • (2002) Metrologia , vol.39 , Issue.4 , pp. 361-369
    • Willink, R.1    Hall, B.D.2
  • 121
    • 0001440281 scopus 로고    scopus 로고
    • Electrical resistance standards and the quantum Hall effect
    • Witt T J 1998 Electrical resistance standards and the quantum Hall effect Rev. Sci. Instrum. 69 2823-43
    • (1998) Rev. Sci. Instrum. , vol.69 , Issue.8 , pp. 2823-2843
    • Witt, T.J.1
  • 122
    • 31144468367 scopus 로고    scopus 로고
    • A multi-frequency impedance analysing instrument for eddy current testing
    • Yin W, Dickinson S J and Peyton J 2006 A multi-frequency impedance analysing instrument for eddy current testing Meas. Sci. Technol. 17 393-402
    • (2006) Meas. Sci. Technol. , vol.17 , Issue.2 , pp. 393-402
    • Yin, W.1    Dickinson, S.J.2    Peyton, J.3
  • 123
    • 0028733441 scopus 로고
    • A new calibration method for impedance meters
    • Yonekura T 1994 A new calibration method for impedance meters IMTC/94 Conf. Proc. (Hamamatsu, Japan, 10-12 May 1994) vol 2 pp 1004-7
    • (1994) IMTC/94 Conf. Proc. , vol.2 , pp. 1004-1007
    • Yonekura, T.1
  • 124
  • 125
    • 0033703957 scopus 로고    scopus 로고
    • Dielectric measurements and analysis for the design of conductor/insulator artificial dielectrics
    • Youngs I J 2000 Dielectric measurements and analysis for the design of conductor/insulator artificial dielectrics IEE Proc., Sci. Meas. Technol. 147 202-8
    • (2000) IEE Proc., Sci. Meas. Technol. , vol.147 , Issue.4 , pp. 202-208
    • Youngs, I.J.1
  • 126
    • 33749449620 scopus 로고    scopus 로고
    • An upper bound to the frequency dependence of the cryogenic vacuum-gap capacitor
    • Zimmerman N M, Simonds B J and Wang Yicheng 2006 An upper bound to the frequency dependence of the cryogenic vacuum-gap capacitor Metrologia 43 383-8
    • (2006) Metrologia , vol.43 , Issue.5 , pp. 383-388
    • Zimmerman, N.M.1    Simonds, B.J.2    Yicheng, W.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.