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Volumn 56, Issue 6, 2007, Pages 2160-2163

Evaluation of a capacitance scaling system

Author keywords

Calibration; Capacitance; Four terminal pair 4TP capacitance; Inductance capacitance resistance (LCR) meter; Inductive voltage dividers (IVDs); Uncertainty; Uncertainty analysis; Voltage control

Indexed keywords

CALIBRATION; CAPACITORS; ERROR ANALYSIS; INDUCTANCE MEASUREMENT; UNCERTAINTY ANALYSIS; VOLTAGE CONTROL; VOLTAGE DIVIDERS;

EID: 37249047385     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2007.908318     Document Type: Article
Times cited : (8)

References (9)
  • 1
    • 0031117702 scopus 로고    scopus 로고
    • Capacitance scaling system
    • Apr
    • T. Aoki and K. Yokoi, "Capacitance scaling system," IEEE Trans. Instrum. Meas., vol. 46, no. 2, pp. 474-476, Apr. 1997.
    • (1997) IEEE Trans. Instrum. Meas , vol.46 , Issue.2 , pp. 474-476
    • Aoki, T.1    Yokoi, K.2
  • 2
    • 37249059203 scopus 로고    scopus 로고
    • A calibration procedure for a programmable capacitance standard
    • Torino, Italy, Jul
    • S. Avramov-Zamurovic, A. Koffman, and B. Waltrip, "A calibration procedure for a programmable capacitance standard," in Proc. IEEE CPEM, Torino, Italy, Jul. 2006, pp. 648-649.
    • (2006) Proc. IEEE CPEM , pp. 648-649
    • Avramov-Zamurovic, S.1    Koffman, A.2    Waltrip, B.3
  • 3
    • 0002521012 scopus 로고
    • Techniques for comparing four-terminal-pair admittance standards
    • R. D. Cutkosky, "Techniques for comparing four-terminal-pair admittance standards," J. Res. Nat. Bur. Stand., vol. 74C, pp. 63-78, 1970.
    • (1970) J. Res. Nat. Bur. Stand , vol.74 C , pp. 63-78
    • Cutkosky, R.D.1
  • 4
    • 37249085995 scopus 로고    scopus 로고
    • Non-linearity evaluation method of four-terminal-pair (4TP) LCR meter
    • Washington, DC, Jun
    • K. Suzuki, A. Yamazaki, and K. Yokoi, "Non-linearity evaluation method of four-terminal-pair (4TP) LCR meter," in Proc. NCSL Int. Workshop Meas., Washington, DC, Jun. 2001.
    • (2001) Proc. NCSL Int. Workshop Meas
    • Suzuki, K.1    Yamazaki, A.2    Yokoi, K.3
  • 5
    • 0033723234 scopus 로고    scopus 로고
    • The sensitivity of a method to predict a capacitor's frequency characteristics
    • Apr
    • S. Avramov-Zamurovic, A. D. Koffman, N. M. Oldham, and B. C. Waltrip, "The sensitivity of a method to predict a capacitor's frequency characteristics," IEEE Trans. Instrum. Meas., vol. 49, no. 2, pp. 398-404, Apr. 2000.
    • (2000) IEEE Trans. Instrum. Meas , vol.49 , Issue.2 , pp. 398-404
    • Avramov-Zamurovic, S.1    Koffman, A.D.2    Oldham, N.M.3    Waltrip, B.C.4
  • 6
    • 0033687507 scopus 로고    scopus 로고
    • Uncertainty analysis for four-terminal-pair capacitance and dissipation factor characterization at 1 MHz and 10 MHz
    • Apr
    • A. D. Koffman, S. Avramov-Zamurovic, B. C. Waltrip, and N. M. Oldham, "Uncertainty analysis for four-terminal-pair capacitance and dissipation factor characterization at 1 MHz and 10 MHz," IEEE Trans. Instrum. Meas., vol. 49, no. 2, pp. 346-348, Apr. 2000.
    • (2000) IEEE Trans. Instrum. Meas , vol.49 , Issue.2 , pp. 346-348
    • Koffman, A.D.1    Avramov-Zamurovic, S.2    Waltrip, B.C.3    Oldham, N.M.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.