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Volumn , Issue , 2005, Pages 143-146

A bridge for high-frequency capacitance scaling

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC IMPEDANCE; MEASUREMENTS; UNCERTAINTY ANALYSIS;

EID: 84899118620     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (2)

References (5)
  • 1
    • 0037390645 scopus 로고    scopus 로고
    • Four terminal-pair impedances and scattering parameters
    • L. Callegaro, F. Durbiano, "Four terminal-pair impedances and scattering parameters", Measurement Science and Technology vol. 14, pp. 523-529, 2003.
    • (2003) Measurement Science and Technology , vol.14 , pp. 523-529
    • Callegaro, L.1    Durbiano, F.2
  • 3
    • 0033689179 scopus 로고    scopus 로고
    • Calibration of IVDs at frequencies up to 1 MHz by permuting capacitors
    • July
    • S. A. Awan, B. P. Kibble, I. A. Robinson, "Calibration of IVDs at frequencies up to 1 MHz by permuting capacitors", IEE-Proc. Sci. Meas. Technol., vol. 147, pp. 193-195, July 2000.
    • (2000) IEE-Proc. Sci. Meas. Technol , vol.147 , pp. 193-195
    • Awan, S.A.1    Kibble, B.P.2    Robinson, I.A.3
  • 5
    • 0035720944 scopus 로고    scopus 로고
    • Automated system for inductance realization traceable to ac resistance with a three-voltmeter method
    • Dec
    • L. Callegaro, V. DElia, "Automated system for inductance realization traceable to ac resistance with a three-voltmeter method", IEEE Trans. Instr. Meas. Vol 50, pp. 1630-1633, Dec. 2001.
    • (2001) IEEE Trans. Instr. Meas , vol.50 , pp. 1630-1633
    • Callegaro, L.1    Delia, V.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.