How electronics changed impedance measurements

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 1, Issue , 2004, Pages 2-8

  Hall, Henry P ^a,b  

^a TERADYNE INC   (United States)

^b NONE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BRIDGE CIRCUITS; CAPACITANCE MEASUREMENT; COMPUTER SYSTEMS; ELECTRIC RESISTANCE MEASUREMENT; ELECTRON TUBES; INDUCTANCE MEASUREMENT; INTEGRATED CIRCUITS; MICROPROCESSOR CHIPS; NATURAL FREQUENCIES; OPERATIONAL AMPLIFIERS; TEST FACILITIES;

CAPACITANCE BRIDGES; COMMERCIAL INSTRUMENTS; PASSIVE COMPONENTS; PRODUCTION-TEST BRIDGES;

MEASUREMENT THEORY;

EID: 4644255939     PISSN: 10915281     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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