Numerical computations and measurements on calculable resistance standards based on NiCr thin film

CPEM Digest (Conference on Precision Electromagnetic Measurements)

Volumn , Issue , 2004, Pages 370-371

  Bounouh, A ^a  

^a LABORATOIRE NATIONAL DE MÉTROLOGIE ET D ESSAIS LNE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

THIN FILM DEVICES; THIN FILMS;

AC RESISTANCES; CALCULABLE RESISTANCE STANDARDS; FINITE ELEMENTS ANALYSIS SOFTWARES; FREQUENCY PERFORMANCES; METALLIC THIN FILMS; NICR THIN FILMS; NUMERICAL COMPUTATIONS; STRAIGHT WIRES;

RESISTORS;

EID: 48349111030     PISSN: 05891485     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CPEM.2004.305619     Document Type: Conference Paper

References (4)

1. A. Caizergues et al, Rapport LCIE no 1149 (1993).
2. R. Haddad, Thesis Master of Science in electrical metrology, Georges Washington university (1969)
3. D. L. H. Gibbings, Proc. Inst. Elec. Eng. 110, 335 (1963).
4. M. Bellon et al, Dig. CPEM'90, Washington DC, 450 (1998).