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1
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0043092566
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An optimal multiline TRL calibration algorithm
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D. F. Williams, C. M. Wang, and U. Arz, "An optimal multiline TRL calibration algorithm," in IEEE MTT-S Int. Microwave Symp. Dig., June 2003, pp. 1819-1822.
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IEEE MTT-S Int. Microwave Symp. Dig., June 2003
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Williams, D.F.1
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2
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0026188064
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A multiline method of network analyzer calibration
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July
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R. B. Marks, "A multiline method of network analyzer calibration," IEEE Trans. Microwave Theory Tech., vol. 39, pp. 1205-1215, July 1991.
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Marks, R.B.1
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3
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0025445789
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De-embedding and unterminating microwae test fixtures with nonlinear least squares
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June
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D. F. Williams "De-embedding and unterminating microwae test fixtures with nonlinear least squares," IEEE Trans. Microwave Theory Tech., vol. 38, pp. 787-791 June 1990.
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(1990)
IEEE Trans. Microwave Theory Tech.
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Williams, D.F.1
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4
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0022732904
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On-line accuracy assessment for the dual six-port ANA: Statistical methods for random errors
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June
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R. M. Judish and G. F. Engen, "On-line accuracy assessment for the dual six-port ANA: Statistical methods for random errors," IEEE Trans. Instrum. Meas., vol. IM-36, pp. 507-513 June 1987.
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Judish, R.M.1
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5
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0028447122
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Flexible vector network analyzer calibration with accuracy bounds using an 8-term or a 16-term error correction model
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June
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H. Van Hamme and M. Vanden Bossche, "Flexible vector network analyzer calibration with accuracy bounds using an 8-term or a 16-term error correction model," IEEE Trans. Microwave Theory Tech., vol. 42, pp. 976-987, June 1994.
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Van Hamme, H.1
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6
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Calibration of a wideband IF nonlinear vectorial network analyzer
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W. Van Moer and Y. Rolain, "Calibration of a wideband IF nonlinear vectorial network analyzer," in 53rd ARFTG Conf. Dig., June 1999, pp. 98-103.
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53rd ARFTG Conf. Dig., June 1999
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Van Moer, W.1
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7
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33749814450
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Calibration in multiconductor transmission lines
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D. F. Williams, "Calibration in multiconductor transmission lines," in 48th ARFTG Conf. Dig., Orlando, FL, Dec. 4-6, 1996, pp. 46-53.
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48th ARFTG Conf. Dig., Orlando, FL, Dec. 4-6, 1996
, pp. 46-53
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Williams, D.F.1
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8
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0031141638
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Multiconductor transmission line characterization
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May
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D. F. Williams, "Multiconductor transmission line characterization," IEEE Trans. Comp., Packag., Manufact. Technol. B, vol. 20, pp. 129-132 May 1997.
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Williams, D.F.1
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9
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0032651422
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Multiconductor transmission line characterization: Representations, approximations, and accuracy
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Apr.
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D. V. Williams, J. E. Rogers, and C. L. Holloway, "Multiconductor transmission line characterization: Representations, approximations, and accuracy," IEEE Trans. Microwave Theory Tech., vol. 47, pp. 403-409, Apr. 1999.
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Williams, D.V.1
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10
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0034429010
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Asymmetric coupled CMOS lines: An experimental study
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Dec.
-
U. Arz, D. F. Williams, D. K. Walker, and H. Grabinski, "Asymmetric coupled CMOS lines: An experimental study," IEEE Trans. Microwave Theory Tech., vol. 48, pp. 2409-2414, Dec. 2000.
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11
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0004295650
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User's reference guide for ODRPACK version 2.01 software for weighted orthogonal distance regression
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NIST, Boulder, CO, Internal Rep. NISTIR 92-4834, June
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P. T. Boggs, R. H. Byrd, J. E. Rogers, and R. B. Schnabel, "User's reference guide for ODRPACK version 2.01 software for weighted orthogonal distance regression," 1992.
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Boggs, P.T.1
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13
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Cambridge, U.K.: Cambridge Univ. Press
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W. H. Press, B. P. Flannery, S. A. Teukolsky, and W. T. Vetterling, Numerical Recipes. Cambridge, U.K.: Cambridge Univ. Press, 1986.
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Numerical Recipes
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14
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55149083640
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An analysis of vector measurement accuracy enhancement techniques
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D. Rytting, "An analysis of vector measurement accuracy enhancement techniques," presented at the RF and Microwave Symp. Exhibition, 1980.
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RF and Microwave Symp. Exhibition, 1980
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Rytting, D.1
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15
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84860753372
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Formulation of the basic vector network analyzer error model including switch terms
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R. B. Marks, "Formulation of the basic vector network analyzer error model including switch terms," in 50th ARFTG Conf. Dig., Dec. 4-5, 1997, pp. 115-126.
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50th ARFTG Conf. Dig., Dec. 4-5, 1997
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Marks, R.B.1
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16
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0003513083
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Guidelines for evaluating and expressing the uncertainty of NIST measurement results
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NIST, Boulder, CO, Tech. Note 1297
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B. N. Taylor and C. E. Kuyatt, "Guidelines for evaluating and expressing the uncertainty of NIST measurement results," NIST, Boulder, CO, Tech. Note 1297, 1994.
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17
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0026170230
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Characteristic impedance determination using propagation constant measurement
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June
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R. B. Marks and D. F. Williams, "Characteristic impedance determination using propagation constant measurement," IEEE Microwave Guided Wave Lett., vol. 1, pp. 141-143, June 1991.
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IEEE Microwave Guided Wave Lett.
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Marks, R.B.1
Williams, D.F.2
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19
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0742329697
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Planar resistors for probe station calibration
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D. F. Williams and R. B. Marks, and J. M. Morgan, "Planar resistors for probe station calibration," in 40th ARFTG Conf. Dig., Dec 1-9, 1992.
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40th ARFTG Conf. Dig., Dec 1-9, 1992
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Williams, D.F.1
Marks, R.B.2
Morgan, J.M.3
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