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Volumn 1, Issue , 2004, Pages 383-386

Four terminal-pair impedance comparisons at high frequency

Author keywords

Bridge circuits; Calibration; Impedance; Impedance measurement

Indexed keywords

BRIDGE CIRCUITS; CALIBRATION; CAPACITORS; ELECTRIC GENERATORS; ELECTRIC INDUCTORS; ELECTRIC POTENTIAL; RESISTORS;

EID: 4644259709     PISSN: 10915281     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (3)

References (13)
  • 1
    • 0031701614 scopus 로고    scopus 로고
    • Proposals for extending traceable impedance measurements to higher frequencies
    • B. P. Kibble, "Proposals for extending traceable impedance measurements to higher frequencies," Metrologia, vol. 35, pp. 17-20, 1998.
    • (1998) Metrologia , vol.35 , pp. 17-20
    • Kibble, B.P.1
  • 2
    • 0035306891 scopus 로고    scopus 로고
    • A new four terminal-pair bridge for traceable impedance measurements at frequencies up to 1 MHz
    • S. A. Awan, B. P. Kibble, I. A. Robinson, and S. P. Giblin, "A new four terminal-pair bridge for traceable impedance measurements at frequencies up to 1 MHz," IEEE Trans. Instr. Meas., vol. 50, pp. 282-285, 2001.
    • (2001) IEEE Trans. Instr. Meas. , vol.50 , pp. 282-285
    • Awan, S.A.1    Kibble, B.P.2    Robinson, I.A.3    Giblin, S.P.4
  • 4
    • 0033687507 scopus 로고    scopus 로고
    • Uncertainty analysis for four-terminal-pair capacitance and dissipation factor characterization at 1 and 10 MHz
    • Apr.
    • A. D. Koffman, S. Avramov-Zamurovic, B. C. Waltrip, and N. M. Oldham, "Uncertainty analysis for four-terminal-pair capacitance and dissipation factor characterization at 1 and 10 MHz," IEEE Trans. Instr. Meas., vol. 49, pp. 346-348, Apr. 2000.
    • (2000) IEEE Trans. Instr. Meas. , vol.49 , pp. 346-348
    • Koffman, A.D.1    Avramov-Zamurovic, S.2    Waltrip, B.C.3    Oldham, N.M.4
  • 5
    • 0037390645 scopus 로고    scopus 로고
    • Four terminal-pair impedances and scattering parameters
    • L. Callegaro and F. Durbiano, "Four terminal-pair impedances and scattering parameters," Meas. Sci. Technol., vol. 14, pp. 523-529, 2003.
    • (2003) Meas. Sci. Technol. , vol.14 , pp. 523-529
    • Callegaro, L.1    Durbiano, F.2
  • 7
    • 0002414811 scopus 로고
    • Four-terminal-pair networks as precision admittance and impedance standards
    • Jan.
    • R. D. Cutkosky, "Four-terminal-pair networks as precision admittance and impedance standards," Commun. Electron., vol. 70, pp. 19-22, Jan. 1964.
    • (1964) Commun. Electron. , vol.70 , pp. 19-22
    • Cutkosky, R.D.1
  • 8
    • 0002521012 scopus 로고
    • Techniques for comparing four-terminal-pair admittance standards
    • _, "Techniques for comparing four-terminal-pair admittance standards," J. Res. Nat. Bur. Stand. (Eng. and Instr.), vol. 74C, 1970.
    • (1970) J. Res. Nat. Bur. Stand. (Eng. and Instr.) , vol.74 C
  • 10
    • 0033689179 scopus 로고    scopus 로고
    • Calibration of IVDs at frequencies up to 1 MHz by permuting capacitors
    • July
    • S. A. Awan, B. P. Kibble, and I. A. Robinson, "Calibration of IVDs at frequencies up to 1 MHz by permuting capacitors," IEE Proc-Sci. Meas. Technol., vol. 147, pp. 193-195, July 2000.
    • (2000) IEE Proc-sci. Meas. Technol. , vol.147 , pp. 193-195
    • Awan, S.A.1    Kibble, B.P.2    Robinson, I.A.3
  • 11
    • 4644250136 scopus 로고
    • A wide range capacitance-conductance bridge
    • R. H. Cole and P. M. Cross, "A wide range capacitance-conductance bridge," Rev. Sci. Instrum., vol. 20, pp. 252-260, 1949.
    • (1949) Rev. Sci. Instrum. , vol.20 , pp. 252-260
    • Cole, R.H.1    Cross, P.M.2
  • 12
    • 0014884334 scopus 로고
    • Accurate immittance measurements at frequencies up to 20 MHz
    • Nov.
    • L. D. White, "Accurate immittance measurements at frequencies up to 20 MHz," IEEE Trans. Instr. Meas., vol. IM-49, pp. 331-336, Nov. 1970.
    • (1970) IEEE Trans. Instr. Meas. , vol.IM-49 , pp. 331-336
    • White, L.D.1
  • 13
    • 0035720944 scopus 로고    scopus 로고
    • Automated system for inductance realization traceable to ac resistance with a three-voltmeter method
    • Dec.
    • L. Callegaro and V. D'Elia, "Automated system for inductance realization traceable to ac resistance with a three-voltmeter method," IEEE Trans. Instr. Meas, vol. 50, pp. 1630-1633, Dec. 2001.
    • (2001) IEEE Trans. Instr. Meas , vol.50 , pp. 1630-1633
    • Callegaro, L.1    D'Elia, V.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.