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Applied Physics Letters

Volumn 94, Issue 11, 2009, Pages

Work function engineering in low-temperature metals

(4) Orf, Nicholas D a Baikie, Iain D c Shapira, Ofer b Fink, Yoel a,b

a USA (United States)

b MASSACHUSETTS INSTITUTE OF TECHNOLOGY (United States)

c KP TECHNOLOGY LTD (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ALLOYING; BINARY ALLOYS; EMISSION SPECTROSCOPY; MELTING POINT; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICES; SMELTING; TIN; TITANIUM COMPOUNDS; WORK FUNCTION;

CONDUCTING ELECTRODES; KELVIN-PROBE METHODS; LARGE-AREA DEVICES; LOW TEMPERATURES; LOW-MELTING TEMPERATURES; MELTING TEMPERATURES; METAL WORK FUNCTIONS; PROCESSING APPROACHES; ULTRAVIOLET PHOTOEMISSION SPECTROSCOPIES;

METAL MELTING;

EID: 63049121932 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3089677 Document Type: Article

Times cited : (44)

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