Interference phenomena in nanocrystalline materials and their application in the microstructure analysis

Zeitschrift fur Kristallographie, Supplement

Volumn , Issue 27, 2008, Pages 15-26

  Rafaja, D ^a   Klemm, V ^a   Wustefeld Ch ^a   Motylenko, M ^a   Dopita, M ^a,b   Schwarz, M ^a   Barsukova, T ^a   Kroke, E ^a  

^a TU BERGAKADEMIE FREIBERG   (Germany)

^b CHARLES UNIVERSITY   (Czech Republic)

Author keywords

Nanocrystalline materials, partial coherence of crystallites; TEM; XRD

Indexed keywords

EID: 62749191225     PISSN: 0930486X     EISSN: None     Source Type: Journal    
DOI: 10.1524/zksu.2008.0004     Document Type: Conference Paper

References (50)

1. Snyder, R.L., Fiala, J. & Bunge, H.J. (editors), 1999, Defect and Microstructure Analysis by Diffraction (Oxford University Press).
2. Mittemeijer, E.J. & Scardi, P. (editors), 2003, Diffraction Analysis of the Micro-structure of Materials (Berlin: Springer).
3. Warren, B.E., 1990, X-ray Diffraction (New York: Dover).
4. Krivoglaz, M.A., 1996, X-ray and Neutron Diffraction in Non-ideal Crystals (Berlin: Springer).
5. Williamson, G.K. & Hall, A.H., 1953, Acta Metall. Mater., 1, 22.
6. Wilkens, M., 1970, Phys. Status Solidi A, 2, 359.
7. Langford, J.I. & Wilson, A.J.C., 1978, J. Appl. Cryst., 11, 102.
8. Adler, T. & Houska, CR., 1979, J. Appl. Phys., 50, 3282.
9. Houska, CR. & Smith, T.M., 1981, J. Appl. Phys., 52, 748.
10. Langford, J.I. & Louër, D., 1982, J. Appl. Cryst., 15, 20.
11. Keijser, Th.H. de, Langford, J.I., Mittemeijer, E.J. & Vogels, A.B.P., 1982, J. Appl. Cryst, 15, 308.
12. Delhez, R., de Keijser, Th.H. & Mittemeijer, E.J., 1982, Z. Anal. Chem., 312, 1.
13. Vargas, R., Louër, D. & Langford, J.I., 1983, J. Appl. Cryst, 16, 512.
14. Groma, I., Ungár, T. & Wilkens, M., 1988, J. Appl. Cryst, 21, 47.
15. Klimanek, P. & Kuzel, R., 1988, J. Appl. Cryst, 21, 59.
16. Kužel, R. & Klimanek, P., 1988, J. Appl. Cryst, 21, 363.
17. Kužel, R. & Klimanek, P., 1989, J. Appl. Cryst, 22, 299.
18. Balzar, D., Von Dreele, R.B., Bennett, K. & Ledbetter, H., 1998, J. Appl. Phys., 84, 4822.
19. Langford, J.I., Louër, D. & Scardi, P., 2000, J. Appl. Cryst, 33, 964.
20. Ungár, T., Gubicza, J., Ribárik, G. & Borbély, A., 2001, J. Appl. Cryst, 34, 298.
21. Scardi, P. & Leoni, M., 2001, Acta Cryst. A, 57, 604.
22. Estevez-Rams, E., Martinez, J., Penton-Madrigal, A. & Lora-Serrano, R., 2001, Phys. Rev. B, 63, 054109.
23. Popa, N. C. & Balzar, D., 2002, J. Appl. Cryst, 35, 338.
24. Estevez-Rams, E., Leoni, M., Scardi, P., Aragon-Fernandez, B. & Fuess, H., 2003, Phil. Mag., 83, 4045.
25. Leoni, M., Gualtieri, A.F. & Roveri, N., 2004, J. Appl. Cryst, 37, 166.
26. Ungár, T., Tichy, G., Gubicza, J. & Hellmig, R.J., 2005, Powder Diffraction, 20, 366.
27. Balogh, L., Ribárik, G. & Ungár, T., 2006, J. Appl. Phys., 100, 023512.
28. Scardi, P. & Leoni, M., 2006, /. Appl. Cryst, 39, 24.
29. Ortiz, A.L., Cumbrera, F.L. & Sánchez-Bajo, F., 2006, J. Appl. Cryst, 39, 598.
30. Van Berkum, J.G.M., Delhez, R., de Keijser, Th.H. & Mittemeijer, E.J., 1996, Acta Cryst. A, 52, 730.
31. Rafaja, D., Klemm, V., Schreiber, G., Knapp, M. & Kuzel, R., 2004, J. Appl. Cryst, 37,613.
32. Ribárik, G., Audebrand, N., Palancher, H., Ungár, T. & Louër, D., 2005, J. Appl. Cryst, 38, 912.
33. Comedi, D., Zalloum, O.H.Y., Irving, E.A., Wojcik, J., Roschuk, T., Flynn, M.J. & Mascher, P., 2006, J. Appl. Phys., 99, 023518.
34. Mandal, T.K., 2007, Mater. Letters, 61, 850.
35. Rafaja, D., Poklad, A., Klemm, V., Schreiber, G., Heger, D., Sima, M. & Dopita, M., 2006, Thin Solid Films, 514, 240.
36. Rafaja, D., Dopita, M., Rǔzicka, M., Klemm, V., Heger, D., Schreiber, G. & Sima, M., 2006, Surf. Coat. Technol, 201, 2835.
37. Rafaja, D., Poklad, A., Klemm, V, Schreiber, G., Heger, D. & Sima, M., 2007, Mat. Sci. Eng. A, 462, 279.
38. Rafaja, D., Wüstefeld, Ch., Dopita, M., Řzicka, M., Klemm, V., Schreiber, G., Heger, D. & Sima, M., 2007, Surf. Coat. Technol, 201, 9476.
39. Rafaja, D., Klemm, V., Motylenko, M., Schwarz, M.R., Barsukova, T., Kroke, E., Frost, D., Dubrovinsky, L. & Dubrovinskaia, N., 2008, J. Mater. Res., 23, 981.
40. th edition (Cambridge: University Press).
41. nd edition (New York: Springer).
42. Mughrabi, H., 1983, Acta Metall, 31, 1367.
43. Kurdyumov, A.V., Britun, V.F. & Petrusha, I.A., 1996, Diam. Relat. Mater., 5, 1229.
44. Huang, J. & Zhu, Y.T., 2000, Defect and Diffusion Forum, 186-187, 1.
45. Williams, D.B. & Carter, C.B., 1996, Transmission Electron Microscopy III - Imaging (New York: Plenum Press).
46. Randl, V., 1992, Microtexture determination and its applications (London: Inst, of Materials).
47. Klemm, V., Klimanek, P. & Seefeldt, M., 1999, phys. stat. sol. a, 175, 569.
48. Frank, F.C., 1950, Report on the Symposium on Plastic Deformation of Crystalline Solids, Carnegie Institute of Technology and Office of Naval Research (Washington: U.S. Government Printing Office), page 150.
49. Wüstefeld, Ch., Rafaja, D., Dopita, M. & Klemm, V., Z. Kristallographie, this issue.
50. Motylenko, M., Klemm, V., Schreiber, G., Rafaja, D., Schwarz, M., Barsukova, T. & Kroke, E., Z. Kristallographie, this issue.