Some consequences of the partial crystallographic coherence between nanocrystalline domains in Ti-Al-N and Ti-Al-Si-N coatings

Thin Solid Films

Volumn 514, Issue 1-2, 2006, Pages 240-249

  Rafaja, D ^a   Poklad, A ^a   Klemm, V ^a   Schreiber, G ^a   Heger, D ^a   Sima M ^b   Dopita, M ^c  

^a TU BERGAKADEMIE FREIBERG   (Germany)

^b SHM Ltd   (Czech Republic)

^c CHARLES UNIVERSITY   (Czech Republic)

Author keywords

Hardness; Nanostructures; Nitrides; Transmission electron microscopy; X ray diffraction

Indexed keywords

COATINGS; COMPOSITION; CRYSTALLINE MATERIALS; RESIDUAL STRESSES; TRANSMISSION ELECTRON MICROSCOPY; VACUUM;

CRYSTALLITE BOUNDARIES; ELECTRON PROBE MICROANALYSIS; NANOCRYSTALLINE DOMAINS;

CRYSTALLOGRAPHY;

EID: 33745759748     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2006.02.092     Document Type: Article

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