Analytical formulation of the variance method of line-broadening analysis for Voigtian X-ray diffraction peaks

Journal of Applied Crystallography

Volumn 39, Issue 4, 2006, Pages 598-600

  Sánchez Bajo, Florentino ^a   Ortiz, Angel L ^a   Cumbrera, Francisco L ^a  

^a UNIVERSITY OF EXTREMADURA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33746443955     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889806017122     Document Type: Article

References (17)

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