Observation of bistable resistance memory switching in CuO thin films

Applied Physics Letters

Volumn 94, Issue 10, 2009, Pages

  Kim, C H ^a   Jang, Y H ^a   Hwang, H J ^a   Sun, Z H ^a   Moon, H B ^b   Cho, J H ^a  

^a Pusan National University   (South Korea)

^b Nextron Corporation   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC PROPERTIES; THIN FILMS;

ATOMIC FORCE MICROSCOPES; BISTABLE RESISTANCES; CONDUCTING PATHS; ELECTRICAL PROPERTIES; FREQUENCY DEPENDENTS; HIGH RESISTANCES; IMPEDANCE PROPERTIES; IMPEDANCE SPECTROSCOPIES; LOW RESISTANCES; MEMORY SWITCHING; NANO-SCALE; RESISTANCE SWITCHING;

COPPER OXIDES;

EID: 62549118726     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3098071     Document Type: Article

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