Breaking resolution limits in ultrafast electron diffraction and microscopy

Proceedings of the National Academy of Sciences of the United States of America

Volumn 103, Issue 44, 2006, Pages 16105-16110

  Baum, Peter ^a   Zewail, Ahmed H ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Electron autocorrelation; Femtosecond electron pulses; Ultrafast imaging

Indexed keywords

ARTICLE; ELECTRON DIFFRACTION; ELECTRON MICROSCOPY; ELECTRON TRANSPORT; IMAGING SYSTEM; OPTICAL RESOLUTION; PRIORITY JOURNAL; TECHNIQUE; ULTRAFAST ELECTRON DIFFRACTION; ULTRAFAST ELECTRON MICROSCOPY;

ELECTRONS; MICROSCOPY, ELECTRON; TIME FACTORS;

EID: 33750818085     PISSN: 00278424     EISSN: None     Source Type: Journal    
DOI: 10.1073/pnas.0607451103     Document Type: Article

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