Ultrafast Diffraction Imaging of the Electrocyclic Ring-Opening Reaction of 1,3-Cyclohexadiene

Journal of Physical Chemistry A

Volumn 105, Issue 17, 2001, Pages 4169-4171

  Dudek, Ray C ^a   Weber, Peter M ^a  

^a BROWN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

RING OPENING REACTIONS; ULTRAFAST DIFFRACTION IMAGING;

ELECTRON DIFFRACTION; ELECTRONIC STRUCTURE; IMAGE ANALYSIS; ISOMERS; MOLECULAR SPECTROSCOPY; MOLECULAR STRUCTURE; MOLECULES; ULTRAFAST PHENOMENA; ULTRASHORT PULSES;

AROMATIC COMPOUNDS;

EID: 0035799952     PISSN: 10895639     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp010122t     Document Type: Article

References (57)

1. Zewail, A. H. J. Phys. Chem. A 2000, 104, 5660-5694.
2. Time-resolved diffraction; Helliwell, J. R., Rentzepis, P. M., Eds.; Clarendon Press: Oxford, 1997.
3. Mourou, G.; Williamson, S. Appl. Phys. Lett. 1982, 41, 44.
4. Williamson, S.; Mourou, G. Phys. Rev. Lett. 1984, 52, 2364.
5. Becker, R. S.; Higashi, G. S.; Golovchenko, J. A. Phys. Rev. Lett. 1984, 52, 307-310.
6. Elsayed-Ali, H. E.; Norris, T. B.; Pessot, M. A.; Mourou, G. A. Phys. Rev. Lett. 1987, 58, 1212.
7. Elsayed-Ali, H. E.; Herman, J. W. Rev. Sci. Instrum. 1990, 61, 1636.
8. Elsayed-Ali, H. E.; Herman, J. W. Appl. Phys. Lett. 1990, 57, 1508.
9. Elsayed-Ali, H. E. Time-resolved reflection high-energy electron diffraction of metal surfaces. In Time-Resolved Electron and X-ray Diffraction; SPIE: San Diego, 1995; Vol. 2521.
10. Elsayed-Ali, H. E.; Weber, P. M. Time-resolved surface electron diffraction. In Time-resolved electron and X-ray diffraction; Rentzepis, P. M., Helliwell, J., Eds.; Oxford University Press: New York, 1997.
11. Schafer, L.; Ewbank, J. D.; Siam, K.; D. W., P.; Monts, D. L. J. Mol. Struct. 1986, 145, 135-142.
12. Ewbank, J. D.; Schafer, L.; Paul, D. W.; Monts, D. L.; W. L., F. Rev. Sci. Instrum. 1986, 57, 967-972.
13. Monts, D. L.; Ewbank, J. D.; Siam, K.; Faust, W. L.; Paul, D. W.; Schafer, L. Appl. Spectrosc. 1987, 41, 631-635.
14. Schafer, L.; Ewbank, J. D. Acta Chem. Scand. 1988, A42, 358-366.
15. Ewbank, J. D.; Faust, W. L.; Luo, J. Y.; English, J. T.; Monts, D. L.; Paul, D. W.; Dou, Q.; Schafer, L. Rev. Sci. Instrum. 1992, 63, 3352-3358.
16. Ewbank, J. D.; Luo, J. Y.; English, J. T.; Liu, R.; Faust, W. L.; Schafer, L. J. Phys. Chem. 1993, 97, 8745-8751.
17. Ischenko, A. A.; Spiridonov, V. P.; Schafer, L.; Ewbank, J. D. J. Mol. Struct. 1993, 300, 115-140.
18. Ischenko, A. A.; Ewbank, J. D.; Schafer, L. J. Mol. Struct. 1994, 320, 147-158.
19. Ewbank, J. D.; Schäfer, L.; Ischenko, A. A. J. Mol. Struct. 1994, 321. 265-278.
20. Ischenko, A. A.; Ewbank, J. D.; Lobastov, V. A.; Schafer, L. Stroboscopic gas electron diffraction: a tool for structural kinetic studies of laser-excited molecules. In Time-Resolved Electron and X-ray Diffraction; SPIE: San Diego, 1995, Vol. 2521.
21. Ischenko, A. A.; Ewbank, J. D.; Schafer, L. J. Phys. Chem. 1995, 99, 15790-15797.
22. Maggard, P.; Lobastov, V. A.; Schafer, L.; Ewbank, J. D. J. Phys. Chem. 1995, 99, 13115-13117.
23. Ischenko, A. A.; Schäfer, L.; Ewbank, J. D. J. Mol. Struct. 1996, 376, 157-171.
24. Lobastov, V. A.; Ewbank, J. D.; Schafer, L.; Ischenko, A. A. Rev. Sci. Instrum. 1998, 69, 2633-2643.
25. Ischenko, A. A.; Schäfer, L.; Luo, J. Y.; Ewbank, J. D. J. Phys. Chem. 1994, 98, 8673-8678.
26. Williamson, J. C.; Zewail, A. H. Proc. Natl. Acad. Sci. U.S.A. 1991, 88, 5021-5025.
27. Williamson, J. C.; Dantus, M.; Kim, S. B.; Zewail, A. H. Chem. Phys. Lett. 1992, 196, 529-534.
28. Williamson, J. C.; Zewail, A. H. J. Phys. Chem. 1994, 98, 27662781.
29. Williamson, J. C.; Cao, J.; Ihee, H.; Frey, H.; Zewail, A. H. Nature 1997, 386, 159-162.
30. Dantus, M.; Kim, S. B.; Williamson, J. C.; Zewail, A. H. J. Phys. Chem. 1994, 98, 2782-2796.
31. Ihee, H.; Cao, J.; Zewail, A. H. Chem. Phys. Lett. 1997, 281, 1019.
32. Cao, J.; Ihee, H.; Zewail, A. H. Proc. Natl. Acad. Sci. U.S.A. 1999, 96, 338-342.
33. Ben-Nun, M.; Cao, J.; Wilson, K. R. J. Phys. Chem. A 1997,101, 8743-8761.
34. Geiser, J. D.; Weber, P. M. High Repetition Rate Time-Resolved Gas Phase Electron Diffraction. In Time-Resolved Electron and X-ray Diffraction; SPIE: San Diego, 1995; Vol. 2521.
35. Ben-Nun, M.; Martinez, T. J.; Weber, P. M.; Wilson, K. R. Chem. Phys. Lett. 1996, 262, 405-414.
36. Geiser, J. D.; Weber, P. M. J. Chem. Phys. 1998, 108, 8004-8011.
37. Ryu, S.; Weber, P. M.; Stratt, R. M. J. Chem. Phys. 2000, 112, 1260-1270.
38. Larson, B. C.; White, C. W.; Noggle, T. S.; Mills, D. Phys. Rev. Lett. 1982, 48, 337.
39. Whitlock, R. R.; Obenschain, S. P.; Grun, J.; Stamper, J. A.; Sprague, J. A.; Sweeney, B. V.; Ripin, B. H.; Craxton, R. S. J. Appl. Phys 1986, 61, 131.
40. Whitlock, R. R.; Wark, J. S. X-ray diffraction by crystals during shocks. In Time-Resolved Electron and X-ray Diffraction; SPIE: San Diego, 1995; Vol 2521.
41. Whitlock, R. R.; Wark, J. S. Phys. Rev. B 1995, 52, 8-11.
42. Srajer, V.; Teng, T.; Ursby, T.; Pradervand, C.; Ren, Z.; Adachi, S.; Schildkamp, W.; Bourgeois, D.; Wulff, M.; Moffat, K. Science 1996, 274, 1726-1729.
43. Tomov, I. V.; Anderson, T.; Rentzepis, P. M. J. X-Ray Sci. Technol. 1993, 4, 44.
44. Tomov, I. V.; Chen, P.; Rentzepis, P. M. J. Appl. Crystallogr. 1995, 28, 358.
45. Tomov, I. V.; Chen, P.; Rentzepis, P. M. Rev. Sci. Instrum. 1995, 66, 5214.
46. Tomov, I. V.; Chen, P.; Rentzepis, P. M. Ultrashort hard x-ray pulses for time-resolved x-ray diffraction. In Time-Resolved Electron and X-ray Diffraction; SPIE: San Diego, 1995; Vol 2521.
47. Tomov, I. V.; Oulianov, D. A.; Chen, P.; Rentzepis, P. M. J. Phys. Chem. B 1999, 103, 7081 -7091.
48. Barty, C. P. J.; Ráksi, F.; Rose-Petruck, C.; Schafer, K. J.; Wilson, K. R.; Yakovlev, V. V.; Yamakawa, K.; Jiang, Z.; Ikhlef, A.; Côté, C. Y.; Kieffer, J.-C. Ultrafast x-ray absorption and diffraction. In Time-Resolved Electron and X-ray Diffraction; SPIE: San Diego, 1995; Vol. 2521.
49. Rose-Petruck, C.; Guo, T.; Ráksi, F.; Squier, J. A.; Walker, B.; Weber, P. M.; Wilson, K. R.; Barty, C. P. J. Measurement .of Ultrafast Dynamics in GaAs Crystals Using Time-Resolved X-ray Diffraction. Presented at Application of High Field & Short Wavelength Sources Topical Meetins; Santa Fe: NM, 1997.
50. Leemans, W. P.; Schoenlein, R. W.; Volfbeyn, P.; Chin, A. H.; Glover, T. E.; Balling, P.; Zolotorev, M.; Kirn, K. J.; Chattopadhyay, S.; Shank, C. V. Phys: Rev. Lett. 1996, 77, 4182-4185.
51. Schoenlein, R. W.; Leemans, W. P.; Chin, A. H.; Volfbeyn, P.; Glover, T. E.; Balling, P.; Zolotorev, M.; Kim, K.-J.; Chattopadhyay, S.; Shank, C. V. Science 1996, 274, 236-238.
52. Schick, C. P.; Weber, P. M. J. Phys. Chem. A 2001, 105, 3725.
53. Hargittai, I. A Survey: The gas-phase electron diffraction technique of molecular structure determination. In Stereochemical applications of gas-phase electron diffraction; Hargittai, I., Hargittai, M., Eds.; VCH: Weinheim, 1988; pp 1-54.
54. Reid, P. J.; Lawless, M. K.; Wickham, S. D.; Mathies, R. A. J. Phys. Chem. 1994, 98, 5597-5606.
55. Pullen, S. H.; Anderson, N. A.; Walker, L. A.; Sension, R. J. J. Chem. Phys. 1998, 108, 556-563.
56. Garavelli, M.; Celani, P.; Fato, M.; Bearpark, M. J.; Smith, B. R.; Olivucci, M.; Robb, M. A. J. Phys. Chem. A 1997, 101, 2023-2032.
57. Shibata, S.; Hirota, F. Information on electron density distribution from high-energy electron scattering. In Stereochemical applications of gas-phase electron diffraction; Hargittai, I., Hargittai, M., Eds.; VCH: Weinheim, 1988; pp 107-138.