Stress perturbation method for the assessment of cathodoluminescence probe response functions

Applied Spectroscopy

Volumn 63, Issue 2, 2009, Pages 185-191

  Wenliang, Z H U ^a   Munisso, Maria Chiara ^a   Matsutani, Atsuo ^a   Wanyin, G E ^a   Pezzotti, Giuseppe ^a  

^a KYOTO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Cathodoluminescence spectroscopy; PRF; Probe response function; Stress analysis

Indexed keywords

ACCELERATION VOLTAGES; BAND GAPS; CATHODOLUMINESCENCE SPECTROSCOPY; CRACK-TIP; DATA RESTORATIONS; DEFECT BANDS; ELECTRON PROBES; EQUILIBRIUM CRACKS; FOCAL PLANES; IN PLANES; LINE SCANS; LUMINESCENCE BANDS; LUMINESCENCE INTENSITIES; OXYGEN EXCESS; PRF; PROBE RESPONSE FUNCTION; SCATTERING LENGTHS; SEMICONDUCTOR CRYSTALS; SPECTRAL POSITIONS; STRESS FIELDS; STRESS PERTURBATIONS;

CATHODOLUMINESCENCE; CHROMIUM; CORUNDUM; CRACKS; ELECTRONS; EMISSION SPECTROSCOPY; GALLIUM ALLOYS; GALLIUM NITRIDE; LIGHT; LIGHT EMISSION; MULTIPHOTON PROCESSES; OXYGEN; PERTURBATION TECHNIQUES; RUBY; SAPPHIRE; SEMICONDUCTING GALLIUM; SEMICONDUCTOR MATERIALS; SINGLE CRYSTALS; STRENGTH OF MATERIALS; STRESS ANALYSIS;

PROBES;

EID: 61349192694     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/000370209787392085     Document Type: Article

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