Electron probe response function and piezo-spectroscopic behaviour of semiconductor materials in presence of highly graded stress fields

Journal of Physics D: Applied Physics

Volumn 39, Issue 23, 2006, Pages 4975-4986

  Pezzotti, G ^a   Zhu, W ^a   Leto, A ^a   Matsutani, A ^a   Porporati, A A ^a  

^a KYOTO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CATHODOLUMINESCENCE; CRACK PROPAGATION; INTERFACES (MATERIALS); PARAMETER ESTIMATION; PIEZOELECTRIC MATERIALS; RESIDUAL STRESSES;

HIGHLY GRADED STRESS FIELDS; MECHANICAL PARAMETERS; PIEZO-SPECTROSCOPIC COEFFICIENT;

SEMICONDUCTOR MATERIALS;

EID: 33846866293     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/39/23/012     Document Type: Article

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