Microcrack-induced strain relief in GaN AlN quantum dots grown on Si(111)

Physical Review B - Condensed Matter and Materials Physics

Volumn 75, Issue 7, 2007, Pages

  Sarusi, G ^a   Moshe, O ^a   Khatsevich, S ^a   Rich, D H ^a   Damilano, B ^b  

^a BEN GURION UNIVERSITY OF THE NEGEV   (Israel)

^b CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33846819970     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.75.075306     Document Type: Article

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