Semicustom design of zigzag power-gated circuits in standard cell elements

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 28, Issue 3, 2009, Pages 327-339

  Shin, Youngsoo ^a   Paik, Seungwhun ^a   Kim, Hyung Ock ^b  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^b SAMSUNG Electronics   (South Korea)

Author keywords

Leakage; Low power; Power gating; Semicustom; Standard cell; Zigzag power gating (ZPG)

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; BENCHMARKING; DESIGN; ELECTRIC BATTERIES; ELECTRIC NETWORK ANALYSIS; ELECTRIC POWER TRANSMISSION NETWORKS; LOGIC DEVICES; SEMICONDUCTOR QUANTUM DOTS; STANDARDS;

LEAKAGE; LOW-POWER; POWER GATING; SEMICUSTOM; STANDARD CELL; ZIGZAG POWER GATING (ZPG);

MULTIOBJECTIVE OPTIMIZATION;

EID: 60749094014     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAD.2009.2012532     Document Type: Article

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