Automated selective multi-threshold design for ultra-low standby applications

Proceedings of the International Symposium on Low Power Electronics and Design, Digest of Technical Papers

Volumn , Issue , 2002, Pages 202-206

  Usami, Kimiyoshi ^a   Kawabe, Naoyuki ^a   Koizumi, Masayuki ^a   Seta, Katsuhiro ^a   Furusawa, Toshiyuki ^a  

^a TOSHIBA CORPORATION   (Japan)

Author keywords

Automated design; Multi threshold; Standby leakage current

Indexed keywords

CELLULAR TELEPHONE SYSTEMS; CMOS INTEGRATED CIRCUITS; CODE DIVISION MULTIPLE ACCESS; DIGITAL SIGNAL PROCESSING; ELECTRIC BATTERIES; GATES (TRANSISTOR); LEAKAGE CURRENTS; MICROPROCESSOR CHIPS;

AUTOMATED DESIGN; MULTI-THRESHOLD DESIGN; STANDBY LEAKAGE CURRENT;

LOGIC DESIGN;

EID: 0036957192     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/lpe.2002.146737     Document Type: Conference Paper

References (6)

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