Model-free iterative control of repetitive dynamics for high-speed scanning in atomic force microscopy

Review of Scientific Instruments

Volumn 80, Issue 1, 2009, Pages

  Li, Yang ^a   Bechhoefer, John ^a  

^a SIMON FRASER UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC PHYSICS; SIGNAL TO NOISE RATIO;

ACCURATE MOTIONS; ATOMIC FORCES; FEEDFORWARD INPUTS; HIGH-SPEED SCANNING; ITERATIVE CONTROLS; MODEL-FREE; OFFLINE; REAL TIME; REPETITIVE DYNAMICS; REPETITIVE MOTIONS; SECANT METHODS; SIGNAL-TO-NOISE RATIOS; SYSTEM CHARACTERIZATIONS;

ATOMIC FORCE MICROSCOPY;

EID: 59349121375     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3065093     Document Type: Article

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