Extended SET pulses in sequential circuits leading to increased SE vulnerability

IEEE Transactions on Nuclear Science

Volumn 55, Issue 6, 2008, Pages 3077-3081

  Narasimham, Balaji ^a   Amusan, Oluwole A ^a   Bhuva, Bharat L ^a   Schrimpf, Ronald D ^a   Holman, W Timothy ^a  

^a VANDERBILT UNIVERSITY   (United States)

Author keywords

Charge sharing; Multi node charge collection; Pulse width; Single event; Single event transient (SET)

Indexed keywords

ADDERS; ELECTRIC NETWORK TOPOLOGY; LOGIC CIRCUITS; SWITCHING CIRCUITS;

CHARGE SHARING; MULTI-NODE CHARGE COLLECTION; PULSE WIDTH; SINGLE EVENT; SINGLE-EVENT TRANSIENT (SET);

TRANSIENTS;

EID: 58849147938     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2008.2007121     Document Type: Conference Paper

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