Single event upsets in a 130 NM hardened latch design due to charge sharing

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 2007, Pages 306-311

  Amusan, O A ^a   Sternberg, A L ^a   Witulski, A F ^a   Bhuva, B L ^a   Black, J D ^a   Baze, M P ^b   Massengill, L W ^a  

^a VANDERBILT UNIVERSITY   (United States)

^b BOEING COMPANY   (United States)

Author keywords

Alpha particles; Charge sharing; D flip flop; Deep sub micron; DICE latch; Neutrons; Single event upset; Single events

Indexed keywords

EID: 34548755628     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RELPHY.2007.369908     Document Type: Conference Paper

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