Structure of pentacene thin films

Applied Physics Letters

Volumn 85, Issue 21, 2004, Pages 4926-4928

  Ruiz, Ricardo ^a,b,c,d,e,f   Mayer, Alex C ^a,b,c,d,e,f   Malliaras, George G ^a,b,c,d,e,f   Nickel, Bert ^b,c,d,e,f   Scoles, Giacinto ^b,c,d,e,f   Kazimirov, Alexander ^c,d,e,f   Kim, Hyunjung ^d,e,f   Headrick, Randall L ^e,f   Islam, Zahirul ^f  

^a Cornell University   (United States)

^b PRINCETON UNIVERSITY   (United States)

^c Department of Obstetrics Gynecology   (United States)

^d Sogang University   (South Korea)

^e University of Vermont   (United States)

^f ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; MULTILAYERS; OXIDATION; SILICON; X RAY DIFFRACTION ANALYSIS;

MOLECULAR PACKING; PENTACENE THIN FILMS; SUBMONOLAYER ISLANDS; X-RAY REFLECTIVITY;

THIN FILMS;

EID: 19144368128     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1826229     Document Type: Article

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