Determination of crystallite size and lattice strain in hexaphenyl thin films by line profile analysis

Materials Research Society Symposium - Proceedings

Volumn 561, Issue , 1999, Pages 161-166

  Brandt, H J ^a   Resel, R ^a   Keckes, J ^b,c   Koppelhuber Bitschnau, B ^a   Koch, N ^a   Leising, G ^a  

^a GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

^b INSTITUTE OF CHEMISTRY   (Slovakia)

^c Erich Schmid Institute of Materials Science   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL GROWTH; CRYSTAL LATTICES; CRYSTAL MICROSTRUCTURE; CRYSTAL STRUCTURE; ELECTRON TRANSPORT PROPERTIES; LIGHT EMITTING DIODES; OPTICAL PROPERTIES; ORGANIC MINERALS; STRAIN; VAPOR DEPOSITION; X RAY DIFFRACTION ANALYSIS;

CRYSTALLITE SIZE; HEXAPHENYL THIN FILMS; LATTICE STRAIN; PHYSICAL VAPOR DEPOSITION;

THIN FILMS;

EID: 0033341215     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-561-161     Document Type: Conference Paper

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