Refractive index, optical bandgap and oscillator parameters of organic films deposited by vacuum evaporation technique

Vacuum

Volumn 83, Issue 6, 2009, Pages 984-988

  You, Zhong Zhi ^a   Hua, Gu Jin ^a  

^a SOUTH CENTRAL UNIVERSITY FOR NATIONALITIES   (China)

Author keywords

Optical properties; Thin films; Vacuum evaporation

Indexed keywords

ALUMINA; CERAMIC CAPACITORS; DIELECTRIC PROPERTIES; ELECTRODEPOSITION; ENERGY GAP; EVAPORATION; LIGHT REFRACTION; OPTICAL BAND GAPS; OPTICAL CONSTANTS; OPTICAL PROPERTIES; OPTOELECTRONIC DEVICES; REFRACTIVE INDEX; REFRACTOMETERS; SOLIDS; THIN FILMS; VACUUM; VACUUM EVAPORATION; VAPORS;

8 HYDROXYQUINOLINE ALUMINUM(III); BAND GAPS; BAND-GAP VALUES; DIELECTRIC CONSTANTS; DISPERSION BEHAVIORS; DISPERSION ENERGIES; DISPERSION PARAMETERS; ENVELOPE METHOD; EXTINCTION COEFFICIENT (K); OSCILLATOR ENERGIES; OSCILLATOR PARAMETERS; OSCILLATOR STRENGTH (OS); PHYSICAL PARAMETERS; POTENTIAL APPLICATIONS; TAUC MODEL; TRANSMITTANCE SPECTRUM;

OPTICAL FILMS;

EID: 58749091441     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.vacuum.2008.11.010     Document Type: Article

References (40)

1. Tang C.W., and VanSlyke S.A. Appl Phys Lett 51 (1987) 913
2. Burroughes J.H., Bradley D.D.C., Brown A.R., Marks R.N., Mackay K., Friend R.H., et al. Nature 347 (1990) 539
3. Berggren M., and Inganäs O. Science 267 (1995) 1479
4. You Z.Z., and Dong J.Y. Vacuum 81 (2007) 819
5. Zhong Z., Zhong Y., Liu C., Yin S., Zhang W., and Shi D. Phys Status Solidi A 198 (2003) 197
6. Wan W.M.V., Friend R.H., and Greenham N.C. Thin Solid Films 363 (2000) 310
7. Zhong Z.Y., and Jiang Y.D. Phys Status Solidi A 23 (2006) 3882
8. You Z.Z., and Dong J.Y. Appl Surf Sci 249 (2005) 271
9. Kim J.-S., Ho P.K.H., Greenham N.C., and Friend R.H. J Appl Phys 88 (2000) 1073
10. Gu G., Garbuzov D.Z., Burrows P.E., Venkatesh S., Forrest S.R., and Thompson M.E. Opt Lett 22 (1997) 396
11. Swanepoel R. J Phys E: Sci Instrum 16 (1983) 1214
12. Sathish N., Dhamodaran S., Pathak A.P., Krishna M.G., Khan S.A., Avasthi D.K., et al. Nucl Instr Meth B 256 (2007) 281
13. Saloum S., and Naddaf M. Vacuum 82 (2008) 50
14. Bulovic V., Khalfin V.B., Gu G., Burrows P.E., Garbuzov D.Z., and Forrest S.R. Phys Rev B 58 (1998) 3730
15. Li W., Jones R.A., Allen S.C., Heikenfeld J.C., and Steckl A.J. J Disp Technol 2 (2006) 143
16. Möller S., and Forrest S.R. J Appl Phys 91 (2002) 3324
17. Dalasiński P., Łukasiak Z., Wojdyła M., Re{ogonek}barz M., and Bała W. Opt Mater 28 (2006) 98
18. Wemple S.H., and DiDomenico Jr. M. Phys Rev B 3 (1971) 1338
19. Al-Kuhaili M.F. Vacuum 82 (2008) 623
20. Dakhel A.A. Vacuum 81 (2007) 1101
21. El-Nahass M.M., Farag A.A.M., Ibrahim E.M., and Abd-El-Rahman S. Vacuum 72 (2004) 453
22. Tanaka K. Thin Solid Films 66 (1980) 271
23. DiDomenico Jr. M., and Wemple S.H. J Appl Phys 40 (1969) 720
24. Milosavljević M., Shao G., Gwilliam R.M., Gao Y., Lourenco M.A., Valizadeh R., et al. Thin Solid Films 461 (2004) 72
25. Reddy K.T.R., Reddy P.P., Datta P.K., and Miles R.W. Thin Solid Films 403-404 (2002) 116
26. Agilan S., Mangalaraj S., Narayandass S.K., Velumani S., and Ignatiev A. Vacuum 81 (2007) 813
27. Miles R.W., Reddy K.T.R., and Forbes I. J Cryst Growth 198-199 (1999) 316
28. Vitanov P., Harizanova A., Angelov C., Petrov I., Alexieva Z., and Stefanov P. Vacuum 76 (2004) 215
29. Saravanan S., Anantharaman M.R., Venkatachalam S., and Avasthi D.K. Vacuum 82 (2008) 56
30. Ghosh S., Avasthi D.K., Shah P., Ganesan V., Gupta A., Sarangi D., et al. Vacuum 57 (2000) 377
31. You Z.Z., and Dong J.Y. Microelectron J 38 (2007) 108
32. Heřman D., Šícha J., and Musil J. Vacuum 81 (2006) 285
33. Zhong Z.Y., and Jiang Y.D. J Colloid Interface Sci 302 (2006) 613
34. Burrows P.E., Shen Z., Bulovic V., McCarty D.M., Forrest S.R., Cronin J.A., et al. J Appl Phys 79 (1996) 7991
35. Shi J., and Tang C.W. Appl Phys Lett 80 (2002) 3201
36. You Z.Z., Dong J.Y., and Fang S.D. Phys Status Solidi A 201 (2004) 3221
37. Liu T.-H., Iou C.Y., and Chen C.H. Curr Appl Phys 5 (2005) 218
38. Tsuboi T., Tanigawa M., Kawami S., and Tsuji T. Curr Appl Phys 5 (2005) 633
39. You Z.Z. Microelectron J 38 (2007) 564
40. Iwama Y., Itoh T., Mori T., and Mizutani T. Thin Solid Films 499 (2006) 364