Characterization of copper oxide thin films deposited by the thermal evaporation of cuprous oxide (Cu2O)

Vacuum

Volumn 82, Issue 6, 2008, Pages 623-629

  Al Kuhaili, M F ^a  

^a KING FAHD UNIVERSITY OF PETROLEUM AND MINERALS   (Saudi Arabia)

Author keywords

Annealing; Chemical properties; Copper oxide; Cupric oxide; Cuprous oxide; Optical properties; Structural properties; Thermal evaporation

Indexed keywords

ANNEALING; CONCENTRATION (PROCESS); HEATING; THERMAL EVAPORATION; THIN FILMS; X RAY DIFFRACTION;

ANNEALED FILMS; CUPROUS OXIDE;

COPPER OXIDES;

EID: 38849184116     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.vacuum.2007.10.004     Document Type: Article

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